アルファクス List of Products and Services

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diode bare chips at high speed. <Features> ■ LD chips adhered to a blue sheet are supplied and automatically transported at high speed from gripping ring state to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under two temperature environments. ■ Measurement sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous IL measurement of FRONT light and BACK light is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens system has eliminated the alignment time for wavelength measurement. ■ Up to 13 cameras monitor the presence and condition of LD chips at each position, making it easy to understand operating conditions and adjust various parts. *For more details, please download the PDF or feel free to contact us.

• Analytical Equipment and Devices

This device is an LD test wafer prober that automatically measures the electrical and optical characteristics of VCSEL laser diodes in wafer form under ambient conditions ranging from room temperature (20°C) to high temperature (95°C). <Features> ■ Automatically measures the characteristics of multi-beam VCSELs in wafer form. ■ Combines ALPHAX's measurement technology with MPI's VCSEL wafer prober. ■ MPI is a leading LED prober manufacturer in Taiwan. ■ Measurement items include I-L, I-V, λ, NFP (OPTION), FFP (OPTION). Continuous measurements are performed for each item with a single unit. ■ Achieves high-speed and high-precision measurements. For more details, please download the PDF or feel free to contact us.

• Analytical Equipment and Devices

This is an LD test system that automatically and rapidly measures and sorts the electrical and optical characteristics of long-wavelength laser diodes in bare chip condition. <Features> ■ Fully automated transport from supply to measurement and classification ■ Easy monitoring of operating conditions with up to 13 cameras ■ Capable of measuring at any temperature from +20°C to -100°C ■ Simultaneous IL measurement of FRONT light and BACK light. For more details, please download the PDF or feel free to contact us.

• Analytical Equipment and Devices

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diodes in bare chip state at high speed. <Features> ■ LD chips affixed to a blue sheet can be supplied and stored in a gripping ring state. High-speed fully automated transport from supply to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under one temperature environment. ■ Measurement and sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous measurement of FRONT light and BACK light IL is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens method has eliminated the alignment time for wavelength measurement. ■ Up to 9 cameras monitor the presence and condition of LD chips at each position. This allows for easy understanding of operating conditions and adjustments of various parts.

• Analytical Equipment and Devices

This is a desktop-type LD test system for research purposes. <Features> ■ Dedicated fixtures can be prepared according to the shape of the LD. ■ Measurement items (Front LIV, λ characteristics, FFP H, V) can be automatically measured for one element under specified temperature conditions. ■ There are LD342L for long wavelengths (1200-1650nm) and LD342S for short wavelengths (400-980nm). ■ Options are available for low temperature (from -40°C to +100°C) LT and room temperature (from 20°C to +100°C) NT. ■ The adoption of a focusing lens system eliminates the need for wavelength measurement alignment.

• Analytical Equipment and Devices

We would like to introduce the laser diode testing device 'LD4200E' handled by Alphax. This product allows you to manually set various packaged LDs into a dedicated jig, and by pressing the start button, it automatically measures all items continuously. Our company offers a variety of lineups based on many years of rich experience. Please choose the most suitable system based on the specifications of the device (wavelength, output, etc.), shape (chip, various packages), measurement items, measurement conditions (temperature, etc.), applications, and transport forms. 【Features】 ■ Manually set various packaged LDs into a dedicated jig ■ Automatically measures all items continuously by pressing the start button *For more details, please refer to the PDF materials or feel free to contact us.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The "LD1220TB" is a mass production measurement classification device for LDs in package condition. LDs are classified and stored in trays. They are supplied in tray storage condition, and automatic pickup and continuous measurement are performed. Our company offers a variety of lineups based on many years of rich experience. Please choose the appropriate system based on the specifications of the device (wavelength, output, etc.), shape (chip, various packages), measurement items, measurement conditions (temperature, etc.), applications, and transport forms. 【Features】 ■ LDs are supplied in tray storage condition ■ Automatic pickup and continuous measurement ■ LDs are classified and stored in trays *For more details, please refer to the PDF document or feel free to contact us.

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The "LD3600F" is an LD temperature characteristic testing machine with a UPH that is three times higher than conventional models. It efficiently conducts characteristic tests in the range of -40°C to +85°C, satisfying the old Belcore (now Telcordia) standards. It is capable of testing not only communication LDs (1000nm to 1650nm) but also recording LDs (350nm to 900nm), and can accommodate various device shapes by changing the work holder. 【Features】 ■ Further enhanced standard model LD3600D with a rich track record ■ UPH is three times higher than conventional models (compared to our company) ■ Efficiently conducts characteristic tests in the range of -40°C to +85°C ■ Capable of accommodating various device shapes by changing the work holder ■ Temperature control method employs water-cooled Peltier control *For more details, please refer to the PDF document or feel free to contact us.

• Other inspection equipment and devices