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Our company develops programs for detecting fine circuit defects through image analysis, inspecting the appearance of mobile phones, measuring lengths, positioning, particle analysis, and more. We solve problems in a wide range of fields using various non-contact measurements, inspections, and analyses with image data, providing image analysis solutions that meet our customers' needs. [Development Examples] - Fine circuit defect detection - Mobile phone appearance inspection - Wear inspection of cutting edges - Measurement of tile position, warping, and length using three-dimensional images - Automatic inspection of surface scratches *For more details, please download the PDF or feel free to contact us.
ウェブハンドリングの課題を解決！非接触の塵埃除去装置などを紹介
