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The "VSA M350" is an ultrasonic imaging device that supports various IC inspections, including JEDEC-TRAY IC inspections, 300mm wafer inspections, MLCC inspections, automotive parts inspections, and NO/GO judgment output. It has a pixel count of 100 million pixels and a scanning speed of 1200 mm/s. The measurement range is 350×350×80 mm. 【Specifications (excerpt)】 ■ Measurement range: 350×350×80 (mm) ■ Measurement pitch: 0.001 (mm) ■ Scanning speed: 1200 (mm/s) ■ Standard probe: 35 (MHz) ■ Pixel count: 100 million pixels *For more details, please refer to the PDF document or feel free to contact us.
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Free membership registrationThe "V3000-W" is a wafer inspection machine that supports wafer cassettes for 6 to 12-inch wafers. We also accept requests for the installation of semiconductor production lines and the fabrication of equipment such as all-stainless steel enclosures, tailored to your needs. We accommodate various customizations to meet our customers' diverse requirements. 【Features】 - Constructed with an all-stainless steel enclosure and scanner mechanism - Automatic judgment possible using area and area ratio calculation tools - Inspection results can be managed by a host computer via network - Achieves high inspection throughput with dedicated analysis software for inline inspection and high-speed teaching scans at up to 1200mm/sec *For more details, please download the PDF or contact us.
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