Semi Next List of Products and Services

Our "KGD" is a testing device that performs 4Site parallel testing, capable of conducting static and dynamic tests at both room temperature and high temperature. The UPH is high, ranging from 1000 to 1200, with high testing efficiency, significantly reducing testing costs. It also supports various LD/ULD boxes. The sealed structure of the probe ensures the safety and reliability of the inspection. 【Features】 ■ Compatible with various LD/ULD boxes ■ Temperature range RT-200°C (optional -45°C) ■ Supports 3000V/1200A ■ Capable of full testing with 4Site parallel testing and static + dynamic tests ■ Specially designed circuits guarantee circuit inductance of less than 15nH *For more details, please refer to the PDF document or feel free to contact us.

The Semight PB6800 is a high-end SiC KGD die handler widely adopted in the semiconductor industry. It is specialized for dynamic and static parameter testing at the bare die level of SiC power chips, achieving high-reliability KGD (Known Good Die) sorting. This system employs a modular design and supports various die supply methods, including frame rings, tape & reel, and trays. Additionally, it allows for hard docking connections and testing at multiple stations at both room temperature and high temperature, and it is equipped with high-voltage arc protection features. It is a solution that significantly contributes to improving testing efficiency and yield in the mass production process of SiC power devices.