Testing, Analysis and Measurement

東芝ナノアナリシス

addressKanagawa/Isogo-ku, Yokohama-shi/8 Shin-Sugita-cho, Toshiba Corporation, Yokohama Office
phone045-770-3471
last updated：
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東芝ナノアナリシス List of Catalogs

1～45 item / All 53 items

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Hydrogen annealing evaluation by temperature-programmed desorption gas analysis (TDS)

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Thin Film X-ray Diffraction (XRD)

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Compound identification of hydroxyapatite granules by XRD.

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Temperature cycle test of electronic components

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Solder heat resistance test for surface mount components

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X-ray photoelectron spectroscopy (XPS)

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Cross-sectional observation of automotive bumper coating film.

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Observation of the fine structure of aluminum anodizing.

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Defect evaluation using synchrotron radiation topography

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X-ray irradiation test

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Evaluation of buried interfaces using HAXPES with synchrotron radiation.

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Analysis of Coating Films on Metal Surfaces

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Observation of the cross-sectional shape of the resist pattern.

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Observation of the cross-section of ceramic sintered body

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High-performance magnetic field SIMS

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Observation of the cross-section of porous soft material (paper)

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Composition and state analysis of magnetic metal multilayer films.

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Impurity analysis of the gate electrode/oxide film interface

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Surface and thin film analysis of semiconductors

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Thermal Desorption Gas Analysis (TDS)

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Strain analysis of Si wafers

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Nitrogen concentration analysis of SiC n-buffer layer

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Impurity analysis of GaN gate oxide film

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Evaluation of thin films using X-ray reflectivity measurement (XRR)

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Wafer bevel evaluation technology

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Evaluation of surface oxide film thickness using photoelectron spectroscopy.

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Applications of Total Reflection HAXPES

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XPS analysis of discolored copper material surface

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Particle evaluation of polymer micelles in DDS formulations using SAXS.

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Evaluation of the oxidation state of titanium oxide (TiOx)

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Application of XPS analysis to tablets

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Evaluation of impurity diffusion from the high concentration layer to the lower layer membrane.

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Secondary Ion Mass Spectrometry (SIMS)

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Investigation of internal defects in metal parts

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Evaluation of the printed layer on the metal surface

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Quantitative analysis of X-ray diffraction data using Rietveld refinement.

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High-performance automated SIMS

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Evaluation of crystallinity of ultrathin films by high-temperature XRD.

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Thin Film Analysis and Evaluation

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[Data] Contracted Analysis Service Reliability Evaluation

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[Data] Contracted Analysis Service - Non-destructive Observation

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Real-time X-ray transmission observation of tablet disintegration.

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Observation of the internal state of delayed-release OD tablets.

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Measurement of the particle size distribution of salt particles inside a capsule using a 3D X-ray microscope.

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Three-dimensional X-ray microscopic observation of tablets.

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