Testing, Analysis and Measurement

ヒューブレイン

EstablishmentDecember 1987
capital1000Ten thousand
number of employees58
addressOsaka/Suita-shi/2-2-11 Esaka-cho
phone06-6190-9800
last updated：
ヒューブレインlogo

ヒューブレイン List of Catalogs

1～45 item / All 46 items

Displayed results

Wafer Appearance Inspection Device

Product catalog

Contact this catalog

DLP-type 2D + 3D sensor

Product catalog

Contact this catalog

[Information] AI × Rule-Based Hybrid Image Processing Proposal for High-Level Automated Conveying Technology

Technical data・examples

Contact this catalog

"Free Angle Multi-Surface Inspection Device" Brochure

Product catalog

Contact this catalog

Cutting tool inspection device

Product catalog

Contact this catalog

Lib Extreme Plate Appearance Inspection Device

Product catalog

Contact this catalog

Syringe testing device

Product catalog

Contact this catalog

Counting machine

Product catalog

Contact this catalog

37th Electro Test Japan <Introduction of Exhibited Equipment>

Other documents

Contact this catalog

Wafer chip appearance inspection device (after dicing)

Product catalog

Contact this catalog

Wafer Appearance Inspection Device (Before Dicing)

Product catalog

Contact this catalog

Kyushu Sales Office Information

Other documents

Contact this catalog

Appearance inspection equipment for optical communication / high-frequency components, devices, and modules.

Product catalog

Contact this catalog

Remote system

Technical data・examples

Contact this catalog

Stereo camera system high-speed + high-resolution 3D inspection system

Product catalog

Contact this catalog

Proposal for products that accommodate ultra-small and thin electronic components or large-scale components.

Technical data・examples

Contact this catalog

High-performance desktop appearance inspection machine

Product catalog

Contact this catalog

[Data] Desktop Simple Inspection Machine

Specification document

Contact this catalog

Free Angle Appearance Inspection Machine

Product catalog

Contact this catalog

"High-Speed Component Transfer Machine" Aligns small electronic components and high-function modules in a disassembled state!

Product catalog

Contact this catalog

Pellet and powder foreign matter inspection device

Product catalog

Contact this catalog

Automotive chip component 6-face + 4-edge appearance inspection device

Product catalog

Contact this catalog

Fine Products High-Speed and High-Precision Counting Machine 'HMS Series'

Product catalog

Contact this catalog

Liquid Crystal Glass Appearance Inspection Device

Product catalog

Contact this catalog

Ceramic parts six-sided appearance inspection device (with tray packing function)

Product catalog

Contact this catalog

"Low-cost version" wafer and chip appearance inspection device

Product catalog

Contact this catalog

Tray packing function equipped six-sided appearance inspection device

Product catalog

Contact this catalog

[Chip Component Alignment] 2-Sided Appearance Inspection Device

Product catalog

Contact this catalog

Exhibition Participation Notice: "High-Speed Transfer Machine with Rotary Mount Head" and others.

Other documents

Contact this catalog

Tray packing function equipped two-sided appearance inspection device

Product catalog

Contact this catalog

2D+3D appearance inspection device

Product catalog

Contact this catalog

Multifunctional image processing engine

Product catalog

Contact this catalog

Sheet Appearance Inspection System

Product catalog

Contact this catalog

Pellet and powder foreign matter inspection device

Product catalog

Contact this catalog

PV-Cell Appearance Inspection System

Product catalog

Contact this catalog

Solar cell appearance inspection device

Product catalog

Contact this catalog

Cylindrical component surface appearance inspection device

Product catalog

Contact this catalog

Electronic component six-sided appearance inspection device

Product catalog

Contact this catalog

Small glass panel appearance inspection device

Product catalog

Contact this catalog

Tray packing machine with front and back inspection function

Product catalog

Contact this catalog

2-stage type general-purpose flat appearance inspection device

Product catalog

Contact this catalog

Tray appearance inspection device

Product catalog

Contact this catalog

Wafer chip appearance inspection device

Product catalog

Contact this catalog

Shinshu Matsukawa Office

Company documents

Contact this catalog

Company Overview

Company documents

Contact this catalog