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We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" to improve the quality of automotive equipment. To verify and evaluate the functionality of JTAG Boundary Scan, many LSI manufacturers have adopted 'JTAG ProVision'. Recently, we received a request for cooperation in LSI evaluation from Andor System Support, which has established a technical support system in Japan, on behalf of Spansion Inc. [Case Study] <Spansion Inc.> ■ A company specialized in flash memory and microcontroller/analog solutions ■ Adopted JTAG testing for evaluation and verification of automotive LSI *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a customer who has implemented "JTAG boundary scan testing" in the inspection process of substrate mounting. In response to the increasing demand for BGA mounting, Azbil Taisin has introduced X-ray inspection equipment; however, there were still cases of undetectable issues such as open defects, leading to significant challenges like defect leakage. By implementing JTAG testing, we have successfully reduced the uninspected areas in BGA mounting. [Case Study] ■ Azbil Taisin Co., Ltd. (Northern Nagano Prefecture) - A production base for measurement and control in factories and plants ■ Challenge: Increased uninspected areas in BGA mounting leading to defect leakage *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" for the inspection of LTE measurement devices. By adopting this product, it has become possible to reliably detect solder defects and pattern defects that cannot be identified through X-ray inspection using electrical testing. Additionally, systems that combine large-scale FPGAs and DDR memory were unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. However, by adopting this product, we were able to improve manufacturing quality. 【Case Study】 ■ Anritsu Corporation - Engaged in the field of information and communication, providing measurement solutions globally. ■ Challenges - Unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" during implementation experiments. The introduction of our product effectively resolved the decline in inspection rates and first-pass yields in in-circuit testing (ICT). [Case Study] ■ Konica Minolta Electronics Inc. (Higashi-Yamanashi, Yamanashi Prefecture) - Produces high-density mounted boards and resin molded products for multifunction printers and advanced medical devices. ■ Challenges - Decline in inspection rates and first-pass yields in in-circuit testing. - Increased inspection costs for low-volume, high-variety products. *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a customer who adopted "JTAG boundary scan testing" for failure analysis of BGA-mounted boards. After the introduction of our product, sufficient quality assurance can be achieved even for high-density printed circuit boards equipped with numerous BGA packages. 【Case Study】 ■ Saksa Tech Co., Ltd. Production Technology Department - Manufacturing focused on business phones and IC card reader-related products ■ Challenges - Unable to sufficiently establish test pins due to the large number of BGAs - Unable to adequately identify the cause of defects through functional testing - X-ray inspection cannot determine BGA open failures *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" in the production line of their in-house developed products. For devices compatible with JTAG that are packaged in BGA format, the basic wiring checks are confirmed through JTAG testing before being handed over to the firmware team for boards that consist of DSP (CPU) + RAM + ROM. This approach eliminates wasted development time due to defects in board or component implementation, thereby improving development efficiency. [Case Study] ■ TEAC Corporation, Audio Equipment Division - Development and sales of audio equipment ■ JTAG testing is conducted from the prototype stage to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a case study of a customer who identified defective areas on a BGA implementation board using "JTAG boundary scan testing." By utilizing this product, it became possible to pinpoint the locations of BGA implementation defects at the pin level. A cross-sectional analysis conducted with a microscope on the pins where defects occurred revealed that the cause of the implementation defects was due to the soldering areas being exposed to high temperatures for an extended period. Additionally, by reviewing the temperature management of the solder reflow process, we were able to improve the implementation quality of the board. [Case Study] ■ Oki Electric Communication Systems Co., Ltd. - Mechatronics and electronics design and production contract services ■ Quality assurance of BGA implementation using JTAG testing *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

Our company offers "Sensor Emulation," which allows control of over 1,000 types of PXI modules via USB, LAN, and Wi-Fi, enabling speedy functionality verification and testing. The continuous changes of the sensor are simulated using programmable resistors. It can be configured with a maximum of 0.03% accuracy and over 160 types of resistor modules. *Currently, we are offering a "Utilization Guide" that explains the PXI system in about 80 pages, along with the product catalog! (Please check it out from the download section.) 【Product Features】 ■ The changes of the simulated sensor can be freely controlled from a Windows application. ■ The USB chassis can connect to a PC via USB, LAN, or Wi-Fi. ■ Resistance values can be changed from a Windows PC. ■ The included drivers allow free modification of resistance values from development environments such as NI, LabView, Keysight, VEE, and Microsoft Visual Studio.

• Sensors

"JTAG testing" is a tool that can be utilized from prototype development to mass production and maintenance. It detects solder defects in "invisible and inaccessible" components such as embedded boards and BGA/TSV pins. 【Featured Companies (Total of 7)】 ■ Azbil Corporation… Implemented JTAG testing in the inspection process of board assembly. ■ Anritsu Corporation… Adopted JTAG testing for the inspection of LTE measuring instruments. ■ Oki Electric Communication Systems Co., Ltd.… Achieved detection of defects in BGA-mounted boards using JTAG testing. ■ Konica Minolta Electronics, Inc.… Realized JTAG testing and automation of the production line. ■ Saksa Techno Co., Ltd.… Improved manufacturing quality by identifying defects in BGA-mounted boards at the pin level. ■ Spansion Inc.… Achieved inspection of automotive devices requiring high safety standards through JTAG testing. ■ TEAC Corporation… Conducted JTAG testing from prototypes to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

• Testing Equipment and Devices

We would like to introduce a case where a French automotive testing equipment system integrator adopted the "PXI Automatic Test Solution." This solution allows for the easy construction of HILS testing systems, simulating system failures to achieve design and functional evaluations of ECUs. The company has successfully automated the testing of in-vehicle devices, resulting in the miniaturization of traditional large-scale equipment and cost reduction. 【Automation of In-Vehicle Device Testing】 ■ Engine Control Unit ■ Powertrain Control Module ■ Engine Control Module ■ Body Control Unit ■ Battery Management Unit *For more details, please refer to the PDF document or feel free to contact us.

• Other network tools

The "Compact HILS" is a PXI module that allows for the flexible combination of modules, achieving equipment miniaturization and cost reduction. 【Simulation Examples】 ■ Sensor Simulation - Accelerometer - Resistance Temperature Detector - Thermocouple - Strain Gauge ■ Fault Simulation - Fault insertion in CAN/LIN/FlexRay - Harness disconnection - Short circuits (communication signals, power, GND) ■ Switch Simulation - Switch - Degraded switch ■ Battery Simulation - Supports stacking up to 108 cells *For more details, please refer to the PDF document or feel free to contact us.

• switch

"Sensor Simulation" allows for the rapid establishment of automated testing facilities by using pseudo-sensors corresponding to the following, thereby reducing testing and verification time. ■ Temperature, Pressure (Strain), Force, Angle Sensors Program Resistance / Module ■ Thermocouples Thermocouple Simulation Module ■ Position Sensors (LVDT, RVDT, Resolver) LVDT / RVDT / Resolver Simulation Module ■ Axle Speed Sensors Arbitrary Signal Generator / Module ■ Various Sensors (mainly sensors that sense values in the current range of 4-20mA) Current Loop Simulation Module

• Sensors

"Arm Development Studio" is a tool that can be used for all software development projects, from investigating architectures suitable for product development to developing real-time applications and coding for edge devices. It accelerates system design and software development, enabling high-quality products to be brought to market quickly and achieving high cost performance. Additionally, it is based on the CMSIS standard to enhance code portability and reusability. 【Features】 ■ Early support for all Arm processors ■ A wealth of tools available at all stages of development ■ Comprehensive platform ■ Enhanced efficiency of code portability and reusability ■ Standardization of software interfaces ■ Rapid development of error-free software *For more details, please refer to the PDF materials or feel free to contact us.

• Development support tools (ICE, emulators, debuggers, etc.)

"Arm Keil MDK" is a complete software development solution for Arm Cortex-based microcontrollers. This solution includes an integrated development environment (IDE), debugger, compiler, software packs, and CMSIS. Using these software tools, you can accelerate the development of embedded software projects. [Features] ■ Maximally supports Arm-based microcontrollers (MCUs) ■ Integrates royalty-free software building blocks and real-time operating systems (RTOS) ■ Provides accurate simulation models for Arm CPUs (Cortex-M only) ■ Works with ULINK family debugging/tracing adapters or third-party debugging probes *For more details, please refer to the PDF materials or feel free to contact us.

• Development support tools (ICE, emulators, debuggers, etc.)

"Arm Keil MDK" is a complete software development solution for Arm Cortex-based microcontrollers. This solution includes an integrated development environment (IDE), debugger, compiler, software packs, and CMSIS. By using these software tools, you can accelerate the development of embedded software projects. 【Features】 ■ Maximum support for Arm-based microcontrollers (MCUs) ■ Integration of royalty-free software building blocks and real-time operating systems (RTOS) ■ Provision of accurate simulation models for Arm CPUs (Cortex-M only) ■ Collaboration with the ULINK family of debug/trace adapters or third-party debug probes *For more details, please refer to the PDF materials or feel free to contact us.

• Development support tools (ICE, emulators, debuggers, etc.)

We are introducing a case aimed at automating the functional verification of controller units and responder units for battery management systems (BMS) used in electric vehicles (EVs). 【Battery Simulator Module (6-cell for Electric Vehicles) Overview】 The 6-cell battery simulator (model number: 41-752A) is ideal for emulating the battery stack used in electric vehicles. With its high density and high insulation voltage barrier, it allows for the use of many cells in series, enabling the emulation of up to 108 cells in a single PXI or LXI chassis.

• Secondary Cells/Batteries

The ECU and other controllers that are essential for electric propulsion powertrain systems are extremely important for safe and efficient vehicle operation. Comprehensive sensor and power switching emulation, along with HIL simulation, allows design engineers to obtain the necessary data. With the right data, engineers can simulate actual environmental conditions to optimize control algorithms and conduct non-destructive excursion tests against hazardous external fault conditions (such as motor winding melting) to evaluate the unit's response. It is crucial to find testing solutions that support higher voltages with the flexibility to accommodate both low and high current units requiring power switching in current EVs. By leveraging expertise in electric propulsion systems and thermal management, Pickering's PXI and LXI modules can strategically align appropriate methods with the evolution of powertrain systems.

• Electrical equipment parts

Pickering Interfaces offers digital I/O modules suitable for operating external devices and interfaces. These can be used embedded in PXI systems, and control via LAN is also possible through LXI chassis.

• Instrumentation and Control Systems

When conducting tests, we sometimes manually switch the settings for test requirements. However, manual switching is accompanied by issues such as human error, reproducibility, and time constraints. Additionally, using a matrix switch allows for the measurement of multiple measurement points with a single measuring device. Please consider automating with our extensive range of switch modules! By checking the downloadable PXI switch module map, you can easily view the list of products.

• Testing Equipment and Devices

- Programmable resistor - Resistance sensor simulator - Battery simulator - Switch simulator - Sensor / transducer simulator (strain gauge, thermocouple, LVDT/RVDT/resolver, analog output/current loopback) - Fault insertion switching - Chassis & remote controller - Amplifier & attenuator module - Waveform generation - Digital I/O & prototyping - USB - Power supply - Low voltage / current source - Cable & connector solutions

• Testing Equipment and Devices

We will introduce a method to "automate" verification tasks using PXI & LXI, which are widely used to automate measurements and tests performed "manually" in the field of hardware and software development of overseas electronic devices. It is available for viewing on demand, so you can watch it immediately.

• Other electronic measuring instruments

JTAG boundary scan is a testing method that allows for easy implementation testing of boards with BGA components. It has various advantages, and I believe we can gain insights from the case studies. [Case Studies] - Azbil Corporation: Reduced untested areas with JTAG testing, providing peace of mind to customers! - Anritsu Corporation: JTAG testing supports high-performance and high-quality measurements! - Oki Electric Communication Systems: Achieved BGA implementation assurance through JTAG testing. - Konica Minolta Electronics: Established a consistent and advanced inspection system for high-density implementations. - Saksa Tech: Improved manufacturing quality by pinpointing defects on BGA boards at the pin level. - TEAC Corporation: Enhanced reliability in the early stages of development with JTAG testing. *The company names mentioned in the case studies are as they were at the time permission was granted for the introduction.*

• Circuit Board Inspection Equipment

Arm Keil MDK v6 is a development tool for commercial microcontrollers. It allows development using the official Arm compiler. In addition to the previous tool, Keil MDK v5, Keil MDK v6 includes Run-time FuSa RTS, free middleware, integration with CI/CD development, Visual Studio Code IDE (Integrated Development Environment), and support for command-line tools. It supports software development for microcontroller devices implemented with the Cortex-M series. ● Professional Edition Supports Cortex-M series, Cortex-R4, SecureCore, Arm7, Arm9 ● Essential Edition Supports Cortex-M series ● Community Edition Supports Cortex-M series (not for commercial use)

• Development support tools (ICE, emulators, debuggers, etc.)

The PXI millivolt thermocouple simulator module from Pickering Interfaces is ideal for simulating thermocouples that can accurately output voltages for 32, 24, 16, or 8 channels. It can also be used for sensor emulation in ECU testing. The channels can operate in one of three voltage ranges (±20mV with a resolution of 0.7μV, ±50mV with a resolution of 1.7μV, or ±100mV with a resolution of 3.3μV) to cover various types of thermocouples. Even in the presence of common mode noise in the system, it uses a two-wire output for the reference sensor of the remote output to provide accurate voltage. Additionally, each simulation channel can be set to an open circuit to simulate sensor wiring failures. To enhance accuracy, each channel of the low voltage source records precise calibration data in the module. It also includes a calibration multiplexer for testing and verification purposes. We also offer dedicated cables for connecting the thermocouple simulator to the test system.

• Other inspection equipment and devices

Module 41-670 is equipped with an active circuit that generates signals that can be used for the operation of a DUT (Device Under Test) to measure motion or position using either an LVDT (Linear Variable Differential Transformer), RVDT (Rotary Variable Differential Transformer), or resolver. The 41-670 is available in up to four banks, with each bank utilizing a shared excitation signal to simulate a single 5-wire or 6-wire VDT or resolver, or dual 4-wire outputs. The module can simulate up to four channels of 5 or 6 wires, or eight channels of 4 wires. Pickering's PXI modules can be mounted in an LXI chassis that can be connected via LAN or USB, and control from a PC can be easily achieved using the free software GSFP or various language APIs.

• Other inspection equipment and devices

The custom cable design tool is not only for cables that connect to Pickering Interfaces, but it can also be used to create various types of cables that our customers need. Customers can download the design drawings and related materials for the cables they designed as PDFs, allowing them to set up cable assembly vendors and use this design information to create cables themselves. Of course, if you place an order with us, we will deliver the assembled cables from Pickering Interfaces to you.

• Other inspection equipment and devices

A programmable resistor is a circuit that allows the resistance value to be changed arbitrarily from a PC or similar device. The circuit is composed of relays (reed, EMR, SSR) and resistors, achieving programmable resistance. A resistance circuit that can be changed programmatically is implemented in a module. The programmable resistor module can be mounted in a chassis that can be controlled via PCI, PXI, LAN, or USB from a computer. For control, we provide software called GSPF (General Soft Front Panel), which allows easy control from the computer screen, and APIs are available for various languages (C/C++, LabVIEW, .NET, VB, MATLAB, Python, etc.).

• Circuit Board Inspection Equipment

Automated testing is an effective means to reduce the cost of hardware verification and improve quality. Testing with PXI and LXI modules has a proven track record of high reliability and cost reduction across various industries, including industrial equipment, automotive, avionics, medical, aerospace, and telecommunications. ◎ Reduction of testing time: Eliminates the hassle of reconnecting cables between the inspection equipment and the test subject, thereby shortening the time required for testing. ◎ Accurate reproduction: Allows for the same test to be accurately repeated multiple times without human intervention. ◎ Improvement of quality: Can replicate harsh conditions that are difficult to create in actual environments, as well as conditions with low occurrence frequency.

• Testing Equipment and Devices