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Using a sub-aperture, the surface of the test object is measured under optimal conditions for each part, and the measurement results of each part are combined to calculate the overall surface shape of the test object. Compared to conventional Fizeau interferometers, it becomes possible to measure a wider range of shapes with higher precision. [Product Lineup] 1. ASI(Q) - Can measure flat, spherical, and aspherical shapes up to 300mm in diameter. (Support for larger diameters is also possible) - Can measure a 90° slope (a completely hemispherical surface). - Capable of measuring aspheres with 1000λ. - Achieves high measurement accuracy and high lateral resolution. 2. QIS Interferometer - High slope measurement capability, providing fast and high precision results. - Can measure small radius test surfaces with a wide focus range. - Dramatically improves spot measurement capability in MRF.
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Free membership registrationThe MRF device can accommodate various shapes of workpieces, including flat, spherical, aspherical, freeform, cylindrical surfaces, and prisms, all with a single machine. It is also capable of processing a wide range of materials such as optical glass, crystals, and ceramics. [Product Lineup] 1. Q-flex Series (Q-flex 100, Q-flex 300) - Capable of rotary polishing, raster polishing, and freeform polishing. - Modular design reduces downtime for replacements. Polishing head, magnetic fluid (MR) polishing agent. 2. Large MRF Devices (Q22-600, Q22-750, Q22-1200) - Capable of raster polishing meter-class workpieces. - Allows for the exchange of polishing heads of different sizes. - Can be equipped with a pad polishing head (Q22-1200).
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