エルミネット List of Products and Services

The "K-kit" is a tool that allows for easy TEM observation of liquid samples. It enables the characterization of nanomaterials, strong aggregates, and weak aggregates (NOAAs) in liquid. Liquid samples are encapsulated in a microchamber for use. It is utilized for research purposes in materials science, chemistry, and biology. 【Features】 ■ Can be observed using the standard grid holder included with the TEM ■ Liquid samples are encapsulated in a microchamber for use ■ Convenient, easy to use, and high performance *For more details, please refer to the PDF document or feel free to contact us.

• Other inspection equipment and devices

The Deben product "Tensile Stage" enables the observation of "real-time physical changes in the root structure under applied load," which was not possible with conventional tensile testing. It can be mounted on sample stages such as SEM, AFM, optical microscopes, XRD, and XRM (μXCT), allowing for the application of stress (tensile, compressive) to the measurement sample and the measurement of shape changes. 【Main Features】 ■ Load cells from mN to 20kN ■ Tension, compression, bending ■ Heating and cooling ■ Software control Optional three-point and four-point wiring clamps are available to accommodate stage movement as needed. *For more details, please contact us or download the PDF materials for review.

• Strength Testing Equipment
• Impact Test

The "208HR High-Resolution Turbo Sputter Coater" is a highly reliable sputter coater manufactured by Creighton, designed to deposit conductive films on FESEM samples with high precision. With the design of the magnetron head and an efficient gas introduction mechanism, a variety of target materials can be selected. Furthermore, the ideal movement of independent in-plane rotation, planetary orbit, and axial rotation allows for uniform coating across the entire sample area. 【Features】 ■ Selection of various target materials ■ Accurate film thickness control ■ Movement mechanism for multiple sample stages ■ Chamber geometry with adjustable distance between target and sample ■ Wide adjustment range for operating vacuum levels ■ Space-saving and energy-efficient benchtop design *For more details, please refer to the PDF document or feel free to contact us.

• Coating thickness gauge
• Coater

At Elminet Co., Ltd., we handle electron microscope accessories manufactured by Microtuna Nano. We offer a variety of products, including various sample holders, universal adapters, and sample holder storage boxes. Please feel free to contact us if you have any requests. *For more details, please download the PDF or feel free to contact us.

• Other microscopes

The "Gen5 STEM Detector" features a 1-channel diode configuration through an 80μm diameter aperture with 4-channel diodes (2 pairs wired together). TEM samples can be easily mounted on the included grid holder for 8 or 12 positions. The version of the included grid holder varies depending on the SEM stage type. 【Features】 ○ 1-channel detector for bright field and 4-channel detector for dark field in STEM ○ Excellent TV rate imaging ○ PC control using USB interface ○ Bellows for HV/UHV (optional) ○ Motor-driven insert/retract (optional) For more details, please contact us or download the catalog.

• Other measurement, recording and measuring instruments

The "LP2850" is a next-generation microwave dish processor developed by the American company EB Science, known for its expertise in microwave tissue processing, and completed with extensive user feedback. It combines flexibility, functionality, precise temperature control, various safety features, vacuum exhaust, gas introduction, and stirring mechanisms, catering to a wide range of needs. 【Features】 ○ Easy operation with push-button controls ○ Preset and variable time input ○ Continuous sample processing for up to 1 hour ○ Flexible operation 　→ Fixation, decalcification, dehydration, activation, staining, softening, and more ○ For TEM samples 　→ Embedding, lubrication For more details, please contact us or download the catalog.

• Other physicochemical equipment

The HAADF annular STEM detector is a very powerful method that provides direct information about the local chemistry of nanomaterials at the atomic scale. By installing this detector, the SEM is upgraded with HAADF annular STEM functionality, allowing for the acquisition of HAADF-specific STEM images. When acquiring HAADF images, the detector is designed in an annular shape with a sufficient inner angle to ensure that diffracted electrons from Bragg reflections are not collected. 【Features】 ○ Low kV operation ○ Bright field, LAADF, MAADF, and HAADF detector segments ○ Three simultaneous video outputs ○ Resolution close to SEM level in SE mode ○ 12-position 3.05mm diameter grid holder For more details, please contact us or download the catalog.

• Other measurement, recording and measuring instruments

NanoSIMS 50 is a SIMS developed for ultra-trace analysis and isotope analysis of micro-regions. 【Features】 ○ Ultra-high sensitivity allows for analysis of small areas ○ Simultaneous analysis of 5 elements (5 types of ions) enables perfect isotope ratio and imaging analysis of the same analysis area For more details, please contact us or download the catalog.

• Contract measurement

Deben has developed a highly versatile cool stage for all low to high vacuum SEMs. The cool stage can be easily installed and removed by the user through the available port of the SEM. By cooling the sample to around -25°C and observing SEM images under low vacuum, you can clearly see the difference in water evaporation compared to room temperature. 【Features】 ○ Standard temperature range: -25°C to 50°C (at 50Pa, room temperature 20°C) ○ In-chamber observation with a 5.6” monitor or PC version ○ Interchangeable lenses of 3.6mm, 6mm, and 12mm for selecting observation range ○ Compliant with CE, RoHS, CSA & UL standards For more details, please contact us or download the catalog.

• Other physicochemical equipment

Capabilities of SPARC SPARC is a truly unique analytical method suitable for photonic research of nano and microstructures with deep sub-wavelength resolution. It is useful for the study of micro-nanophotonic structures and their related materials, including metallic (plasmonic, Ag, Au, etc.), dielectric (SiO2, Si3N4, TiO2, etc.), and semiconductor (Si, GaAs, CdTe, etc.) materials.

• Spectroscopic Analysis Equipment
• Other semiconductors
• Analytical Equipment and Devices

This is a battery-operated ammeter capable of measuring current in picoamperes.

• Voltage Meter
• PCB terminal blocks
• Other laboratory equipment and containers