Notice of the Inficon Webinar "Direct Impact of Semiconductor Yield!! Abnormal Detection Using Various Sensors" on July 14 (Friday) from 13:00 to 14:00.

Thank you very much for your continued support of our products. With just a little more time until the end of the rainy season, I hope you are all staying healthy and not suffering from summer fatigue. Now, I would like to inform you about the 48th INFICON Webinar, which has received great acclaim from many participants.
The theme for this session is "Directly Linked to Semiconductor Yield Impact!! Anomaly Detection Using Various Sensors." FDC (Fault Detection and Classification), which monitors whether production equipment is always in the same condition, has now become a standard core system in factories. Furthermore, there is a growing trend of using new sensors to detect process anomalies that were previously undetectable. In this session, we will introduce several cases where we have added various sensors to prevent the creation of defects. Since the content is directly related to preventing yield decline, we invite anyone interested to feel free to participate.
【Webinar Information】
Theme: Directly Linked to Semiconductor Yield Impact!! Anomaly Detection Using Various Sensors
Date and Time: July 14, 2023 (Friday) 13:00 - 14:00
Number of Participants: First 100 people
Q&A: Yes

Date and time | Friday, Jul 14, 2023 01:00 PM ~ 02:00 PM Pre-registration system |
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Entry fee | Free |
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