Deep Dive into Semiconductor Ultra-Trace Analysis - Agilent Semiconductor User Meeting 2024

The semiconductor industry is demanding further trace analysis. An ICP-MS application engineer will introduce points to "deepen" "ultra-trace analysis in semiconductors." Additionally, we will have a presentation from Ias Co., Ltd. titled "Recent Needs for Ultra-trace Metal Impurity Analysis in the Semiconductor Field," which will cover topics such as data integrity and network overview, as well as semiconductor-related analysis cases (clean rooms, PFAS analysis, etc.) using GC/MS and LC/MS, which are gaining attention from semiconductor customers.
We also plan to hold an information exchange session at the seminar venue. This is a valuable opportunity to speak directly with speakers and Agilent application engineers, so please take advantage of this opportunity.

Date and time | Friday, Oct 04, 2024 01:00 PM ~ 05:00 PM In-person venue and online |
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Capital | [In-Person Venue] Ochanomizu Solacity Conference Center 2F Solacity Hall 〒101-0062 4-6 Kanda Surugadai, Chiyoda-ku, Tokyo [Online] Zoom Streaming |
Entry fee | Free |
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