The 39th NePCON Japan

◀Exhibited Products▶
Non-contact Surface Roughness Measurement Device for Equipment Integration Smart Sensor (Sensofar Metrology)
AR Light Guide Plate Grating Analysis System WG-GAT (OptoFidelity)
Automatic Image Inspection System for AR Light Guide Plate Quality for R&D WG-IQ (OptoFidelity)
High-Speed Laser Defect Scanner for Substrates AT Series (Lumina Instruments)

Date and time | Wednesday, Jan 22, 2025 ~ Friday, Jan 24, 2025 |
---|---|
Capital | Tokyo Big Sight East Exhibition Hall Booth Number: E14-36 |
Entry fee | Free Pre-registration system |
Inquiry about this news
Contact Us OnlineMore Details & Registration
Details & Registration