Quantitative analysis of ppt order Na and K in metal matrix samples using semiconductor materials and ICP-MS.

We introduce an ion lens that dramatically reduces the background of Na and K under hot plasma conditions. This provides a solution for ppt-order Na and K analysis in metal matrix samples in the semiconductor field.

Date and time | Friday, Sep 05, 2025 10:30 AM ~ 11:00 AM |
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Capital | Makuhari Messe Conference Hall Room 104 |
Entry fee | Free |
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