We will exhibit a particle visualization system at Medtec Japan, an exhibition and seminar on the design and manufacturing of medical devices. (April 21, 2026 (Tue) - April 23, 2026 (Thu) / Tokyo Big Sight, East Hall 7, Booth 207)
The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity that allows for real-time imaging of the suspended and adhered states of micro and nano-sized particles. We are expanding our sales of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, manufacturing equipment, and factory environments, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally.
In the manufacturing field of medical devices, it is effective for identifying sources of dust generation during the manufacturing process, managing cleanliness, and reducing the risk of foreign matter contamination, contributing to quality improvement and stable production.
The following are some examples of applications, but by utilizing our technology, we can strongly promote the resolution of various issues such as the deterioration of defect rates caused by fine foreign matter, visualization of clean airflow, and concerns regarding site cleanliness.
- Visualization investigation of fine particles and airflow in manufacturing lines and environmental improvement
- Promotion of cleanliness in manufacturing equipment and environments
- Cleanliness evaluation of various equipment performance
- Improvement of yield and quality degradation caused by contamination issues
- Support for research and development requiring visualization of fine particles and airflow
- Evaluation of particle generation from products
| Date and time | Tuesday, Apr 21, 2026 ~ Thursday, Apr 23, 2026 10:00 AM ~ 05:00 PM |
|---|---|
| Capital | 【Venue】 Tokyo Big Sight East Hall 7, Room 207 【Content】 At this exhibition, we will demonstrate various products, including the ultra-sensitive camera "Particle EyeⓇ," the visualization-specific light source "Parallel EyeⓇ H," and the surface visualization tool "D Light." Experience the high particle detection performance at the venue. |
| Entry fee | Free By registering through the URL below, you will be able to enter the venue smoothly. |
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