I want to link various measuring devices with an XY stage to perform measurements of the entire workpiece.
**[Needs]** I want to obtain data for the entire workpiece using measuring instruments such as spectrometers, film thickness gauges, contact angle meters, and laser displacement meters. **[Improvement Example]** By linking various measuring instruments with an XY stage, automatic measurement of the entire workpiece will be performed. It is also easy to create I/O control programs for the measurement start output and end input of the measuring instruments. Even if the measurement target or measurement pitch changes, it can be quickly accommodated by simply changing the map shape. (The function for acquiring and saving measurement data will be required on the measuring instrument side.)
Inquire About This Product
basic information
【Needs】 I want to acquire data for the entire workpiece using measuring instruments such as spectrometers, film thickness gauges, contact angle meters, and laser displacement meters. 【Improvement Example】 By linking various measuring instruments with an XY stage, we can automatically perform measurements of the entire workpiece. It is also easy to create I/O control programs for the measurement start output and end input of the measuring instruments. Even if the measurement target or measurement pitch changes, we can quickly adapt by simply changing the map shape. (The function for acquiring and saving measurement data will be required on the measuring instrument side.)
Price information
-
Delivery Time
Applications/Examples of results
For more details, please contact us by requesting materials.
Company information
We will assist in the "improvement" of research and development and manufacturing fields based on precision motion control and software technology.
