Successfully shortened temperature control significantly with voltage feedback control of FPGA.
We have successfully reduced the temperature control time significantly using voltage feedback control with NI's FPGA. Previously, pressure control required measuring a large number of products at once due to the relationship with temperature control time. This necessitated creating a larger chamber for pressure control, resulting in longer stabilization times. By introducing NI's FPGA, the faster temperature control has allowed us to reduce the number of measurements taken at once. Consequently, we were able to make the pressure control chamber smaller, successfully shortening the pressure stabilization time. Furthermore, we achieved simultaneous measurement of multiple targets using DAQ for voltage and current measurements. This significantly reduced the time required for measurement conditions and multiplied the measurement speed. Initially, the measurement time for a single measurement was 300 seconds for 400 units, which is 0.75 seconds per unit. However, by adopting NI products, the measurement time for a single measurement has been reduced to 3 seconds for 112 units, resulting in approximately 30 times faster measurement at 0.026 seconds per unit.
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(1) Realization of reduced stabilization time for temperature By using a Peltier device and changing to analog voltage feedback control with FPGA, we successfully reduced the temperature stabilization time from nearly one hour to less than one minute. (2) Realization of reduced stabilization time for pressure Previously, due to the relationship with temperature control time, it was necessary to measure a large number of products at once, which meant that it took several minutes for the pressure control tank to stabilize. However, by improving the speed of temperature control and reducing the number of products measured at once to one-twentieth, we succeeded in shortening the pressure stabilization time to several tens of seconds. (3) Realization of support for various product types By using LabVIEW and TestStand to separate the testing, control, and screen processing programs, we were able to efficiently utilize TestStand. By categorizing products by sequence files, we successfully improved maintenance performance to accommodate future product types.
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Temperature control
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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.
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