Close linkage between LSI fault analysis observation/repair equipment and design CAD data.
A domestic CAD navigation system has been developed that can quickly and accurately identify defect locations.
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basic information
【Features】 ◯ Stage linkage between LSI failure analysis observation/repair device and design CAD data ◯ Overlay display of SEM/SIM images and design CAD data ◯ Equipped with data locator function, equipotential node trace function, and a variety of additional options ● For more details, please contact us or refer to the catalog.
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Company information
We engage in contract software development (in the semiconductor field, image processing field, and IoT field) as well as product sales/customization. 〇Semiconductor Field Since our establishment, we have been involved in the development of software tools in the semiconductor EDA field (design tools, test-related interfaces, failure analysis tools), providing extensive services for customer-oriented contract development and the development and sale of proprietary products. 〇Image Processing Field We develop applications in various areas such as appearance inspection (for manufacturing, casting, foreign object and defect detection, measurement, etc.), monitoring of in-factory equipment, and infrastructure. Additionally, we provide a wide range of contract software development including imaging control, GUI development, and equipment control. 〇IoT Field We propose products and services suitable for the construction and operation of IoT environments, along with custom development by our in-house engineers. We also consistently develop driver/firmware using commercial products, web systems, and IoT systems integrated with the cloud. 〇Product Sales/Customization We develop and sell products leveraging our experience in LSI design support CAD, test support CAT, and interface program development.
