Surface and cross-sectional observation of samples, as well as elemental analysis and mapping through X-ray analysis, can be performed.
A Scanning Electron Microscope (SEM) is a device that allows for the magnified observation of surface structures by using secondary electrons and backscattered electrons emitted from the surface as a result of the interaction between an incident electron beam and the constituent atoms of a material. It is widely used for the observation of polymer materials. Additionally, the updated SEM now incorporates an Energy Dispersive X-ray Spectroscopy (EDS) system, enabling elemental analysis (from boron (B) to uranium (U)) and elemental mapping at specific points on the SEM observation screen.
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basic information
【Features】 ○ Enlarged observation of the surface structure of materials ○ Widely used for the observation of polymer materials ○ Elemental analysis at specific points on the SEM observation screen (from boron (B) to uranium (U), and elemental mapping is possible) ● For other functions and details, please contact us.
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At DJK, we respond to all customer needs swiftly and accurately under confidentiality. DJK engages in the following activities related to polymer materials and composite materials: 1. Synthesis, polymerization, and modification reactions 2. Compounding, molding, and sample processing 3. Material testing, physical property measurement, and analysis services 4. Technical consulting 5. Defective product failure analysis testing 6. Application and testing outsourcing for overseas standards (FDA/EPA, DMF, biodegradability certification, and others)
![[Analysis Case Study] Observation of Adhesion State Through Metal Plates Using Ultrasonic Microscopy](https://image.mono.ipros.com/public/product/image/367300/IPROS2705829217984245675.png?w=280&h=280)
