Easily create test patterns! Testing equipment equipped with humidity control function.
The "Orion3" is a test system that can simulate electrostatic discharge phenomena caused by device charging. It is equipped with humidity control functionality and can conduct ESD (CDM) tests compliant with various standards by exchanging the test head. It allows for easy creation of test patterns for any device, minimizing cycle time. 【Features】 ■ Test equipment with humidity control functionality ■ Conducts tests compliant with various standards by exchanging the test head ■ Easily creates test patterns for any device ■ Minimizes cycle time ■ The new feature CDM2 enables a new type of CDM testing that significantly improves the repeatability issues associated with the conventional air discharge method *For more details, please refer to the PDF materials or feel free to contact us.
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basic information
【Specifications (Partial)】 ■ ESD (CDM): Compliant with JEITA (partially), JEDEC, ESDA, AEC ■ Humidity Control: Testing within user-specified humidity range ■ Package Editor: Easily create test patterns for any device ■ Angle Auto-Correction: 2-point alignment function ■ Oscilloscope Interface: Automatically saves discharge events *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Purpose】 ■Simulate electrostatic discharge phenomena caused by static electricity *For more details, please refer to the PDF document or feel free to contact us.*
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Company information
Yamato Corporation's Measurement Equipment Division manufactures and sells inspection, analysis, and evaluation devices necessary for research and development and production in the semiconductor, organic EL, liquid crystal, solar cell, and fuel cell industries. In particular, we specialize in developing devices used in research and development departments that require measurements under special environmental conditions, and we have numerous achievements in delivering to cutting-edge fields. Additionally, we are currently challenging ourselves to integrate conventional probing technology into applied technology fields, aiming to establish a system that can support inspection, analysis, and evaluation in all areas, including applied technologies centered around semiconductors in the future. 【Head Office and Branch Locations】 ◆ Kobe Head Office 〒650-0047 1-4-6 Minamimachi, Port Island, Chuo Ward, Kobe City TEL (078) 304-5178 (DI) FAX (078) 304-6087 ◆ Tokyo Branch 〒107-0062 1-15-9 Minami Aoyama, Minato Ward, Tokyo TEL (03) 3403-0771 FAX (03) 3403-0813 ◆ Nagoya Branch 〒460-0002 2-19-25 Marunouchi, Naka Ward, Nagoya City YH Marunouchi Building TEL (052) 212-4932 FAX (052) 212-4935