Anything can be measured in cross-section if light passes through! From thin films to thick plates!
As a practical industrial application sensor, it can be applied to a wide range of inspection fields such as welding inspection and defect inspection of resin sheets and films, as well as film thickness measurement and displacement measurement. If light passes through, cross-sectional measurement of anything is possible. ◆ Please feel free to download the "Case Study Collection" first ◆ For more details, please contact us through the inquiry form.
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basic information
※ WLI: White Light Interferometer [Tomographic Imaging Method Using Low Coherent Light Interference] Jointly developed with the Shiina Laboratory at Chiba University 【Measurement of Translucent Layer Structures】 ■Measurement Depth: Up to 14mm ■Resolution: 15μm in Depth Direction ■Sampling Frequency: 15Hz ■Wavelength Used: 1310nm (Standard) 850nm ■Light Source: SLD □For more details, please refer to the case study collection.
Price information
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Delivery Time
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Applications/Examples of results
【Purpose】 ○ Utilizing opto-micro vacuum accumulation technology for experimental tools, evaluation machines, and production equipment. ● For more details, please refer to the catalog or contact us.
Detailed information
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Image of utilizing optical interference sensors - Product inspection of glass and resin (internal defects, poor adhesion, etc.) - Displacement and thickness measurement
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Image of utilizing optical interference sensors Film adhesion defect inspection
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Image of utilizing optical interference sensors Measurement of lens center thickness
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Company information
Our company handles everything from design to manufacturing of equipment for research and development purposes, including optical devices, precision instruments, and vacuum equipment.
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