Please use it as a third-party evaluation organization for Pogopin.
Using the conventional 5 pins and 5 new pins (+1 for reference), we will measure resistance values and loads at each lap. In addition to measuring stroke vs. resistance values, we can also measure stroke vs. load, and it is possible to measure resistance values for all cycles (though this will be done one by one). The laps will be conducted at specified counts such as 0, 10k, 50k, 100k, 150k, and 200k. The sliding method will be performed with a specified stroke. For more details, please download the catalog.
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basic information
**Features** - Screening of pogo pins is possible before mass production evaluation, reducing unnecessary evaluation work (ranking). - Analysis of pogo pins that are suspected to be abnormal during mass production is possible, allowing for the identification of unstable factors. - Understanding the sweet spot of pins enables the determination of parameters (stroke settings, load settings) during mass production. - The lifespan of pins can be grasped in advance. - A contest for new pins (numerical comparison evaluation) can be conducted. - Socket management with numerical control can be implemented in mass production. For more details, please contact us or download the catalog.
Price information
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Delivery Time
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Applications/Examples of results
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Company information
TES Sales Co., Ltd. has been engaged in the sale of testing equipment for semiconductor devices since its establishment in February 1970. Based on the experience gained during this time, we are working to maximize the measurement capabilities of testers and to reduce costs by improving contact areas, as well as developing and evaluating contacts. By performing optimal maintenance with the best contacts, we believe we can particularly contribute to reducing the total cost of testing lines for stringent test items and expensive devices. Additionally, we also handle dry cleaning, which has been confirmed to be effective in reducing the tin oxide coating on contact surfaces.
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