Gate Leak Tester [GL Tester]

GL tester that generates a high electric field under high temperature to evaluate the malfunction of devices, compliant with AEC-Q100-006 REV-C.

When a high electric field is applied to an IC at high temperatures, there may be instances of non-compliance with the IC's catalog specifications (for example, Icc, input leakage, AC parameters, functional characteristics). This phenomenon is referred to as electric-thermal-induced parasitic gate leakage (GL). Devices that exhibit GL are considered "defective," but GL defects typically recover after baking at 125°C for 4 hours (or 150°C for 2 hours). This device generates an electric field at high temperatures and conducts GL tests in accordance with AEC-Q100-006 REV-C. There are manual test model 6900M and automatic test model 6900A available. *Please note that product specifications are subject to change without notice. Thank you for your understanding.*

Testing Equipment and Devices