High-quality monitor inspection at optimal magnification is possible with the Takara Leica APO zoom optical system!
This is a visual inspection system for wafer chips that allows operators to reliably identify defective chips while viewing high-quality optical images. It can accurately classify defect locations/categories and image files. The system features an expanding stage that moves in steps, enabling color monitor inspections at optimal magnification suited to chip sizes. For more details, please download and view the catalog.
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basic information
**Features** 1. High-quality monitoring inspection at optimal magnification with Leica APO zoom optical system. 2. Electric stage movement allows for stepwise movement of the workpiece across one surface. 3. High-resolution monitoring inspection with a 2 million pixel color USB camera. 4. Operators can easily manage defect data. (Coordinate registration, variety category registration, image files) 5. The system configuration allows for the inspection machine and gamepad to be connected via USB to a laptop. ◎ You can view detailed specifications and more by downloading the catalog. If you are interested, please download and check the catalog.
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We will collaboratively think about and manufacture prototypes, automatic machines, and online machines for inspection equipment that supports the manufacturing and development of new technologies, tailored to your ideas and requests. We provide everything from the design and manufacturing maintenance of hardware, optical systems, and software for ordered products to after-sales service.
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