Dual-Sided Position Confirmation Microscope DVM-400NEW

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DVM－400NEW

last updated：May 30, 2012

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A microscope that superimposes images of both sides of the specimen within the field of view and compares the amount of displacement, which can be measured using a measuring system.

This is a microscope that overlays images of both sides of the specimen within the field of view and compares the amount of displacement for observation, allowing measurement with a measuring system. The objective lenses come in five types, with magnifications ranging from 50x to 1000x, accommodating a wide variety of samples. It features NIR visible/infrared transmission type. There is also a camera position synthesis device available. For more details, please download the catalog or contact us.

Related Link - http://www.ittec.co.jp/filename42.html

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【Features】 ○ You can overlay images of the specimen for observation and measure the displacement. ○ The dimensional measurement of the specimen can be done with an accuracy of 1μm. ○ You can switch the optical path to inspect only the front or back surface. ○ The optical axis of the upper and lower objective lenses can be aligned. ○ Objective lens replacement is done via a revolving mechanism, allowing inspection of various samples at different magnifications for the upper and lower lenses. ○ Various stages are available, including an electric auto stage. ○ TV observation and measurement of displacement using a mouse can be done within image files and on the monitor. ● You can view detailed specifications and more by downloading the catalog. If you are interested, please download and check the catalog.