Optimal for shipping inspection/receiving inspection.
This is a device that performs four inspection processes: "IR inspection," "front/back surface inspection," "thickness inspection (simple Bow/Warp)," and "resistance value measurement" for solar cell wafers. It can inspect wafers at a high speed of one wafer per second.
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basic information
This is a device that performs four types of inspections for solar cell wafers: "IR inspection," "front/back inspection," "thickness inspection (simple Bow/Warp)," and "resistance measurement." It can inspect wafers at a high speed of one wafer per second. The loader supports either cassette or stack methods. The unloader can categorize the inspection results into 13 different categories. It is also possible to support lifetime measurement as an option. 【Features】 - Capable of high-speed inspection at one wafer per second. - Supports cassette or stack methods. - A cost-effective system.
Price range
P8
Delivery Time
Applications/Examples of results
We can accommodate special specifications. Please feel free to contact us.
Company information
We focus on total system development, including the development and sales of semiconductor inspection equipment and software development. We take pride in our ability to provide development technical expertise, which allows us to propose development products at low prices without charging development fees. When we receive a development project, we first create an evaluation machine and proceed with development using our unique development process. By incorporating customer requests from the early stages of development and prioritizing collaboration with customers, we can offer customized products tailored to the specific requirements of our clients.
