Thickness and optical constant measurement by Auto SE is free for the first 3 samples!!
■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Exclusive offer for customers who apply in November!! We will conduct free measurements of spectral ellipsometry (film thickness and optical constant measurement) for up to 3 samples on the first occasion using Auto SE. ■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Using a newly developed optical model, we will evaluate the quality of DLC films non-destructively and non-contactly. We can perform instant non-destructive measurements from hydrogen-containing DLC films created by various manufacturing methods to hydrogen-free DLC, calculating film thickness and optical constants (refractive index and extinction coefficient). With simple operations, we can measure samples ranging from single-layer films to multilayer films with film thicknesses from 1 nm to 15 μm. Surface analysis using an XYZ electric stage and measurements of micro areas below 100 μm are possible. The imaging system allows for precise confirmation of the sample surface condition and the exact position of the measurement spot. [For more details, please download the catalog or feel free to contact us]
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basic information
【Main Features】 - Accurately measures material properties such as film quality and optical constants (refractive index, extinction coefficient) - Covers wavelengths from 450 to 1,000 nm - Non-destructive and non-contact measurement - Capable of measuring various materials including dielectrics and organic thin films - Imaging system allows for confirmation of the sample surface condition and measurement spot ◇◆Free measurement for up to 3 samples for the first time!◆◇ Customers who apply by the end of November will receive free spectral ellipsometry measurements (film thickness and optical constant measurements) for up to 3 samples using Auto SE. 【For more details, please download the catalog or feel free to contact us】
Price information
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Delivery Time
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Applications/Examples of results
- Quality control of DLC films - Non-destructive, non-contact measurement of thin films (surface analysis, measurement of small areas) - Measurement of characteristics of thin films such as film thickness and optical constants (refractive index, extinction coefficient)
Detailed information
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Confirmation of measurement position by the imaging system Imaging system
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Company information
We established Nanotech Co., Ltd. in 1989, pursuing our dreams in the technologies of "plasma" and "vacuum." Currently, we are developing coating technologies, including DLC (diamond-like carbon), using these technologies. Many of the DLC coating technologies are applied to drills, molds, and machine parts, making them a vital technology that supports the industry behind the scenes. I believe that Japan's status as a "technology-oriented nation" is due to the existence of such remarkable technologies that are not immediately visible, which lead to the creation of high-performance, high-quality products. To meet our customers' needs over the long term, enhancing our internal systems is key, and the ideas and actions of the people working here create a vibrant corporate culture that fosters reliable responses to our customers. We are currently focusing on creating this environment as our top priority.
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