We offer a kit with MMS & CGS, equipped with dedicated electronics and the multifunctional Japanese spectral software WaveVIEWER!
Introducing the CGS kit (high-resolution type) that boasts a high S/N ratio of 5000:1 and enhanced wavelength axis resolution. The "MMS kit" provides excellent reproducibility in applications such as transmittance and reflectance, which are easily affected by noise, and can detect subtle differences that conventional compact spectrometers could not identify. The "CGS kit" is ideal for spectral measurements of light sources with narrow half-widths, such as lasers, and those with many baseline fluctuations, like mercury lamps, within a narrow wavelength range. For more details, please contact us or download the catalog.
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basic information
【Specifications】 <Kit Accessories> ○ Dedicated electronics from tec5 → Combination of front-end board and interface board / Interface options include USB, Ethernet, and PCI ○ Japanese spectral software WaveVIEWER → Functions for spectral data measurement, storage, automatic output, second derivative, and external signal synchronization automatic control <Optional Items> ○ Dedicated case for MMS kit ○ Dedicated case for CGS kit → Available for purchase pre-cased as a spectroscopic device, allowing immediate measurement → Standard equipped with one channel each for I/O terminals → Also includes an electric shutter for automating dark current measurements ○ Incident fiber (2m length) → Quartz optical fiber with SMA connector → Various types available depending on application ○ Software development library → Enables the creation of control software tailored to the customer's unique environment and applications ○ External power supply PS-USB → External power supply for providing power to the interface board for MMS ● For more details, please contact us or download the catalog.
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Company information
Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.
