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  1. Home
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  3. Measurement and Analysis
  4. Analytical Instruments
  5. Spectroscopic Analysis Equipment
  6. Ultra-high-speed spectral measurement device Spectrometer DTSP-150

Ultra-high-speed spectral measurement device Spectrometer DTSP-150

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last updated:Feb 13, 2020

ディスク・テック 本社
ディスク・テック 本社
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Compact with low noise! Back-illuminated Peltier cooling FFT-CCD used.

A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.

    Spectroscopic Analysis Equipment
seihin001.jpg

Ultra-high-speed spectral measurement device Spectrometer DTSP-150

seihin001.jpg
seihin001.jpg
  • Related Link - http://www.disctech.co.jp/dtsp-150-1.htm

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basic information

【Features】 ○ Responds to reading signals of 10 electronics and minute light ○ Uses electronic cooling FFT-CCD, resulting in low noise and compact size ○ Extremely high sensitivity enables fast measurements such as online measurements ○ Color measurement software and film thickness analysis software available ○ Compatible with a total system of hardware, software, and mechanisms using a spectral unit ○ Interfaces available in USB type, E-ther type, and SCSI type ○ External output terminal for LED emission included ● For more details, please contact us.

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Applications/Examples of results

【Application Examples】 - Thickness management of films on various disks - Resist films on semiconductor wafers, SiO - Coating thickness management of optical lenses - Thickness measurement of various films - Inline measurement of alignment films and ITO films on glass substrates - Color measurement of LEDs - We also have experience in building multi-channel systems for inline use. ● For more details, please contact us.

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ディスク・テック

ディスク・テック 本社

Industrial Electrical Equipment

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Disk Tech's image processing is provided by in-house optical engineers, laser engineers, hardware, software, and precision machinery engineers as a total solution. We handle inspection devices utilizing infrared technology, three-dimensional inspection devices, and more. Our proprietary infrared microscope has over 10 years of proven performance.

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