It is possible to analyze how impedance mismatch, loss, emphasis, and the choice of equalization affect signal quality.
By using SISTUDIO, you can analyze how impedance mismatch, loss, emphasis, and equalization choices affect the signal quality of the measurement target. It allows for the emulation or de-embedding of transmission lines using imported measured S-parameter files in Touchstone format. The emphasis and equalization models, as well as the simulated waveforms, can be configured by the user, enabling the display and analysis of the generated EYE diagram, and allowing for a detailed examination of the EYE opening and jitter characteristics at the measurement target and receiving end. SISTUDIO operates on LeCroy's SPARQ software application. Users who have purchased the standalone version of SISTUDIO can unlock the SISTUDIO features of the SPARQ application without needing to connect to SPARQ using a USB license key.
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basic information
● Full signal integrity analysis of equalized received end signals ● High-speed EYE diagram drawing ● Advanced jitter analysis ● Coordinated simulation of transmission characteristics using measured and/or simulation models ● De-embedding and emulation of transmission line and fixture characteristics ● Emulation of CTLE, DFE, and FFE equalizers and PLL ● Can be used independently on a user PC or connected to LeCroy's SPARQ.
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Company information
Teledyne LeCroy Japan, Inc. was established on September 14, 1990, as a wholly-owned subsidiary of Teledyne LeCroy Corporation (New York, USA). We have set up sales offices and support centers in Tokyo and Osaka to meet the needs of our customers in Japan. On November 16, 2001, we obtained ISO 9001:2000 certification. We aim to contribute to our customers' product development and problem-solving by providing technical documentation, analysis software, and technical seminars in Japanese free of charge.