Observation of micro-nano domain morphology using High-Resolution Transmission Electron Microscopy (HR-TEM)
We provide contract analysis services equipped with devices for physical analysis, and we also offer on-site analysis.
The main equipment includes "HR-TEM," "Q-pole type SIMS," "μESCA," and "RAMAN." We have accumulated know-how in micro and nano-level surface analysis, allowing us to provide reliable data in a short period. We also offer advice on the analysis of unknown samples. 【Observation of Micro Areas - High-Resolution Transmission Electron Microscopy (HR-TEM)】 ○ A method that irradiates a thinly processed sample with a high-speed electron beam, providing magnified images and information on crystal structures through the imaging of transmitted and scattered electrons. ○ It is suitable for evaluating the structure and crystallinity of thin films. High-resolution observation enables the examination of crystal structures. ● For more details, please download the catalog or contact us.
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basic information
【Features】 ○ A method that provides magnified images and information on crystal structures by irradiating a thinly processed sample with high-speed electrons and imaging the transmitted and scattered electrons. ○ Suitable for evaluating the structure and crystallinity of thin films. High-resolution observation allows for the examination of crystal structures. ● For more details, please download the catalog or contact us.
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For more details, please contact us.
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Applications/Examples of results
- Observation of semiconductor device structures - Observation of thin film structures - Evaluation of crystal structures - Local composition analysis
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The Ion Tech Center is a professional group that provides consulting and technical development support in "ion implantation," "physical analysis," and research and development. We aim to be a good partner for companies and university researchers as a creative laboratory equipped with cutting-edge technology and facilities that meet the demands of the times.


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