Significantly reduce the time and cost involved in measurement!!
The road paving construction and management system "PAVE Series" consists of the paving drawing creation system "PAVE I," which generates necessary calculation documents and related drawing management diagrams for road paving operations; the cutting and overlay system "PAVE II," which simulates and creates various calculation documents for road cutting and overlay work; the CAD system "PAVE-CAD Pro," used to create drawings for the PAVE series; and the vertical and horizontal measurement design system "PAVE-ROPO," which allows for measuring the road surface and conducting design work without the need for lane restrictions. *For more details, please contact us or download the catalog.
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**Features** ■ PAVEI (Pavement Development Diagram System) ○ Easy input of measurement point names and distances through input assistance functions ○ Simultaneous input of actual values and design values ○ Automatic calculation of design values based on actual values rounded to 5 cm through a linked function ■ PAVE II (Milling Overlay System) ○ Ability to specify milling thickness and overlay thickness for each cross-section ○ Reduced input work for measurement point names, distances, etc., through input assistance functions ○ Capability to set central medians and structures (on CAD), allowing for reproduction of site conditions ○ Freedom to change names of actual values and planned values ■ PAVE-CAD Pro ○ Command bar adopts an office-like operational system ○ Basic attribute windows such as layers are displayed on the right side of the screen for instant understanding of drawing element environments, while the properties window for elements is on the left side ○ Adoption of an extended grip that automatically displays related commands when an element is selected ■ PAVE-ROPO (Vertical and Horizontal Measurement Design System) ○ Measurement from outside the roadway eliminates the need for lane restrictions ○ Measurement can be conducted by a small number of people ○ Significant reduction in measurement costs achieved *For more details, please contact us or refer to the catalog.*
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