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  5. Flaw detection testing
  6. Multi-wave, multi-channel eddy current testing device "ETi-200"

Multi-wave, multi-channel eddy current testing device "ETi-200"

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last updated:Apr 01, 2025

日本マテック
日本マテック
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Compact & Powerful! Eddy current testing device that can use single or dual probes.

The ETi-200 is a multi-wave, multi-channel eddy current testing device that can use either a single or dual probe. With the dual probe, it is possible to switch between 4 channels for each probe, and many settings can be configured from the channel settings screen, not just the frequency. The single probe allows for switching between 8 channels and is equipped with many flexible features and characteristics that are unprecedented for a portable device. 【Features】 ○ High sensitivity and high signal-to-noise ratio analog circuits ○ Latest software including mixing, measurement cursors, alarms, and settings save functions ○ Robust aluminum die-cast housing and rubber mold designed ergonomically ○ Long battery operating time (6-7 hours) with easy battery replacement "quick swap" ○ Eddy current cartridges are detachable for future upgrades and expansions For more details, please contact us or download the catalog.

    Flaw detection testing
09_eti.jpg

Multi-wave, multi-channel eddy current testing device "ETi-200"

09_eti.jpg
09_eti.jpg
  • Related Link - http://www.matech.co.jp/

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【Features】 ○ 7" high-resolution color display ○ Compact for multiple frequencies and multi-channel ○ USB "on-the-go," Ethernet, and SD card compatible ○ User-friendly interface ○ Equipped with an intuitive 'Smart Wheel' for easy operation ● For more details, please contact us or download the catalog.

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Multi-wave, multi-channel eddy current testing device "ETi-200"

Multi-wave, multi-channel eddy current testing device "ETi-200"

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日本マテック

日本マテック

Testing, Analysis and Measurement

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We prepare a wide range of inspection methods and devices, providing suitable inspection methods. To achieve inspection objectives, the selection of optimal means is the first necessity. Our company offers various inspection methods such as UT, ET, MT, PT, RFT, RT, AT, LUT, etc., allowing us to respond broadly to various demands. Furthermore, to meet diverse requirements, we constantly seek the latest technology and make efforts in information gathering and product development to equip ourselves with the most advanced devices from around the world. We assist with all aspects of inspection implementation. Another significant feature of our company is that we do not limit ourselves to merely selling hardware; we independently develop applications, starting with the selection of suitable main devices/probes for the purpose, providing advice on inspection processes, and offering software that includes the development and guidance of inspection methods. Through package sales, we strive to enhance our user support system and technical capabilities to achieve objectives quickly and efficiently.

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