Realization of waveform guarantee on the wafer.
As the development process and the necessity and importance of ESD testing at the wafer and chip level are increasing, it is predicted that the demand for these will significantly rise in the future. This device has been developed as a culmination of the technology accumulated from ESD testing of finished product packages, and it has finally made ESD testing at the wafer level possible. 【Product Lineup】 ○HED-W5040 ○HED-W5000M For more details, please contact us or download the catalog.
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basic information
【Specifications】 ○ Leakage measurement current: 0 to ±100mA ○ Leakage measurement current step: 0.01μA ○ Leakage measurement current accuracy: 0.5% ± (1/500 F.S. ± 10nA) ○ Leakage measurement voltage: 0 to ±40V ○ Leakage measurement voltage step: 0.1V ○ Maximum number of leakage measurement points: 20 points ○ Maximum number of measurement tables: 10 tables ○ Measurement result output formats: Table format, Graph format, CSV save format ○ Power supply voltage: 100V/15A 50/60Hz ● For more details, please contact us or download the catalog.
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Company information
Our company develops and manufactures inspection equipment essential for evaluation measurements and analysis in semiconductor quality control. We hold over 70% market share in the field of measurement and analysis using electrostatic discharge (ESD) technology in the semiconductor industry, establishing a solid position. With the motto of Chance, Challenge, and Change, we will unite as a company to capture the changes of the times and society, continuously evolving in the world of cutting-edge technology.