Ideal for the analysis of thin films and trace elements! Non-destructive analysis of precious metal composition and plating thickness measurement is possible.
The "FISCHERSCOPE(R) X-RAY XAN(R)250/XAN(R)252" is an energy-dispersive fluorescent X-ray analyzer. It allows for non-destructive composition analysis of precious metals and measurement of plating thickness. It is particularly suitable for the analysis of thin films and trace elements. The XAN250 and XAN252 differ in measurement stage and housing size. The "XAN250" is a fixed stage type, while the "XAN252" is a manual XY stage type with a large safety hood. The main measurement targets include thin film measurements of a few nanometers (related to electronics and semiconductors), analysis of regulated substances (such as Pb in toys), and analyses requiring high precision (jewelry, watches, precious metals), as well as universities and research institutions. 【Features】 - Automatically sets the optimal irradiation area and filter for each measurement specification. - The latest silicon drift detector exhibits high precision and detection capability. - Excellent accuracy and long-term stability, saving time and effort in recalibration. - Fischer's FP method allows for theoretical calculations of film thickness analysis, regardless of solid or liquid. For more details, please contact us or download the catalog.
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basic information
【Features】 ○ User-friendly benchtop type analyzer → XAN250: Fixed stage → XAN252: Manual XY stage with large safety hood ○ Measurement direction is bottom illumination (from below) → Major components such as X-ray tube and detector are housed in the lower part of the measuring device ○ Samples are placed on the measurement window (transparent window) for quick and easy alignment ○ Integrated video image with zoom and crosshair → Allows for precise adjustment of measurement position ○ User-friendly WinFTM(R) software → Capable of handling everything from measurement to editing submission forms for measurement data ○ Complies with DIN ISO 3497 and ASTM B 568 ● For more details, please contact us or download the catalog.
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Delivery Time
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Applications/Examples of results
【Main Measurement Targets】 ○ Measurement of thin films in the nanometer range (electronic devices, semiconductor-related) ○ Analysis of regulated substances (such as Pb in toys) ○ Analysis requiring high precision (jewelry, watches, precious metals) ○ Universities and research institutions ● For more details, please contact us or download the catalog.
Company information
Tōei Sangyō Co., Ltd. is headquartered in Sagamihara City, Kanagawa Prefecture, and engages in the sale of "commercial hand soaps and alcohol products, industrial, commercial, and vehicle products, as well as analytical and measuring instruments." With the theme of 'Ecology & Economy,' we contribute to cost savings and improvements in manufacturing and hygiene management levels. We aim to provide products that are friendly to both workers and the global environment, and that will be loved by our customers for a long time.
![[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.](https://image.mono.ipros.com/public/product/image/d3e/2000325882/IPROS6547567656230940718.jpg?w=280&h=280)
