Noise Source Detection System - Detecting Noise Sources through Correlation Calculation -
Detecting the source of electromagnetic noise through "correlation calculation"!
[Features] - 2CH vector signal analysis - Time domain, spectrum analysis, correlation calculation - Correlation calculation between 2CH signals - Capable of searching for the desired signal from multiple noise sources - Automatic switching function for preamplifiers - Storage of IQ data
Inquire About This Product
basic information
Function examples (customizable) - Frequency analysis - Time domain analysis - Coherent analysis - IQ display - 2CH display (simultaneous)
Price range
Delivery Time
Applications/Examples of results
Noise source detection
catalog（1）
Download All Catalogs
Company information
Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.
![[Development Case] Development of DNA Pattern Analysis Device - Biotechnology -](https://image.mono.ipros.com/public/product/image/52c/260046/IPROS_11165243370612380000.jpg?w=280&h=280)
![[Development Case] RFID Test System - Solving UHF Band Null Points -](https://image.mono.ipros.com/public/product/image/fd7/260049/IPROS_17446819669983183000.jpg?w=280&h=280)
![[Development Case] Make Effective Use of TestStand! Development of a Test Bench](https://image.mono.ipros.com/public/product/image/b12/260054/IPROS_18606222924409643000.jpg?w=280&h=280)
