Research tools for high-stress GaN devices

basic information

<Main Features> ■ General-purpose 2D/3D finite element analysis and design software for semiconductor devices ■ Applicable to almost all device design and analysis except for semiconductor lasers ■ Usable for the design of devices made from silicon and compounds <Diverse Physical Models and Functions> ■ Current-voltage (I-V) characteristics ■ Two-dimensional distribution of potential, electric field, and current ■ Two-dimensional distribution of hot carrier temperature in fluid dynamics models ■ Two-dimensional distribution of lattice temperature used in thermal transport models ■ Band diagrams under various bias conditions ■ Results of AC small-signal response analysis at arbitrary frequency ranges ■ Subbands of quantum wells using a carrier mixing model ■ Two-dimensional distribution of impurity occupancy and density trapped at deep levels in semiconductors ■ Two-dimensional optical field distribution of optical devices such as photodetectors ■ Current dependence of the self-emission spectrum of LEDs ■ FDTD interface <Interface> ■ Standard tools for structural input and result display ■ Written in a proprietary scripting language, executable from GUI or command line ■ Programmable control via batch files or scripting language

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Research on high-stress GaN devices