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  6. Optical Measurement and Inspection Device "Wafer-Level Optical Device Characterization System"

Optical Measurement and Inspection Device "Wafer-Level Optical Device Characterization System"

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last updated:Jun 16, 2017

シナジーオプトシステムズ
シナジーオプトシステムズ
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A system for analyzing electrical and optical characteristic measurements at the wafer level.

The "Wafer-Level Optical Device Characterization System" is a system that analyzes the electrical and optical characteristics of light-emitting devices such as VCSELs and LEDs, as well as light-receiving devices like photodiodes and illuminance sensors, at the wafer level. This product combines a prober system for semiconductor failure analysis, such as a semi-auto prober or manual prober, with our various optical measurement systems from the M-Scope series, measurement light sources, and measuring instruments to analyze and collect data on the electrical and optical characteristics of optical semiconductor devices at the wafer level. Additionally, by combining with a semi-auto prober, it is also possible to support automatic measurement of wafers. 【Features】 ■ Capable of measuring various electrical and optical characteristics of light-emitting and light-receiving devices at the wafer level ■ Achieves automation, speed-up, and labor-saving for various measurements ■ Can be equipped with various optical systems from our M-Scope series for optical measurement ■ Includes the Optometrics Customized Version optical measurement and analysis software ■ Capable of wide-ranging applications from individual device measurements to inline use *For more details, please feel free to contact us.

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Optical Measurement and Inspection Device "Wafer-Level Optical Device Characterization System"

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  • Related Link - http://www.synos.jp/system/system_wl.html

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【Application】 ■ Wafer-level analysis of electrical and optical characteristics of light-emitting devices - I-V-L characteristics of light-emitting devices such as VCSELs, analysis of emission beam profiles, analysis of emission wavelengths, modulation frequency characteristics, etc. ■ Wafer-level analysis of electrical and optical characteristics of various light-receiving devices - I-V characteristics, optical sensitivity, dark current, capacitance, modulation frequency characteristics, rise and fall times, tolerance, crosstalk, etc. of light-receiving devices such as photodiodes. *For more details, please feel free to contact us.

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Synergy Opt Systems Co., Ltd. Comprehensive Catalog

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シナジーオプトシステムズ

シナジーオプトシステムズ

Testing, Analysis and Measurement

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Synergy Opt Systems Co., Ltd. aims to create unique and innovative sensors and electro-optical devices that integrate optical technology, sensor technology, electronics, software, and precision mechanism technology. Our engineers, who have extensive experience and achievements in various fields such as optical design, optical sensors, light sources, optical modules, and measurement system design, will analyze your specifications and propose optimal solutions. Additionally, we can custom design and manufacture optical systems based on your specific requirements.

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