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  5. X-ray inspection equipment
  6. X-ray detector array XB8801R series

X-ray detector array XB8801R series

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last updated:Feb 13, 2020

スマートビジョン 本社
スマートビジョン 本社
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CMOS silicon photodiode array detector chip mounted on a single substrate.

A linear detector array composed of CMOS silicon photodiode array detector chips mounted on a single substrate. The imaging circuit of each detector chip consists of a continuous linear array of photodiodes, a timing generator, a digital scan shift register, an array of charge integration amplifiers, a sample-and-hold circuit, and a signal amplification chain. Each detector array is longer to generate an end-of-scan (EOS) used to start scanning the next detector array, while continuous detector arrays are formed from smaller daisy-chained detector arrays. In X-ray scanning applications, a scintillator material tailored to the user's application can be attached to the surface of the detector array to convert X-ray photons into visible light, making them detectable by the photodiode array. The photodiode array reduces radiation damage from X-ray beams. The signal processing circuit is positioned 2mm away from the photodiodes and is shielded from direct X-ray radiation by an outer heavy metal shield. The precise alignment of the metal shield to the signal processing circuit is performed at the factory using specially shaped housings and chip-on-board (COB) technology.

    X-ray inspection equipment
402821_1.jpg

X-ray detector array XB8801R series

402821_1.jpg
402821_1.jpg

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basic information

≪Main Features≫ ● Selectable 2 resolution modes with large element pitch: 0.1/0.2mm ● Various array lengths: - 2.0 inches (512 pixels/0.1mm, 256 pixels/0.2mm) - 4.0 inches (1024 pixels/0.1mm, 512 pixels/0.2mm) ● 5-V power supply ● Simultaneous integration using charge integrating amplifier array ● Digital scan shift register sequential readout ● Low noise with integrated CDS circuit, over 4000 wide dynamic range ● User-specified scintillator materials GOS:Tb, CsI:Tl, etc. ● Long radiation resistance lifespan ≪Applications≫ ● Food and industrial inspection ● Package content inspection ● Security and cargo screening ● Industrial non-destructive testing (NDT) ● Manufacturer: X-Scan Imaging Corporation (USA)

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Non-destructive testing

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スマートビジョン

スマートビジョン 本社

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Our company is an engineering trading firm that provides on-site solutions and systems for quality control, integrating cutting-edge technology and automation. In addition to terahertz devices, we handle advanced and innovative devices such as industrial PCs optimized for image processing and X-ray equipment.

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