We utilize cutting-edge electron microscopy observation techniques to meet the needs of our customers in the pharmaceutical field.
To observe and analyze the extreme surface and cross-section of samples at the nanoscale using electron microscopy, it is essential to have sample preparation techniques that avoid damage and contamination during processing. Our company provides cutting-edge observation and analysis data using ultra-low acceleration voltage scanning electron microscopy (ULV-SEM) and aberration-corrected scanning transmission electron microscopy (Cs-STEM), after processing samples using the optimal methods developed through our accumulated sample preparation technology.
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Ultra-Low Acceleration Voltage SEM Device and Features <Device> ZEISS ULV-SEM ULTRA55 <Features> ■ Observation of extreme surface structures without treatment of insulators ■ Extreme surface composition contrast and state contrast ■ Ultra-high resolution at ultra-low acceleration voltages (4.0nm at 100V, 1.7nm at 1kV) ■ Ultra-high resolution EDX analysis (minimum 31nm) ■ Ultra-high resolution particle analysis
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■Example of Cross-Section Observation and EDX Analysis of Pharmaceutical Samples ●Observation Example of Sugar-Coated Tablet for Rhinitis ・In this example, cross-section observation using SEM confirms that the tablet has a multilayer structure consisting of five layers. ・EDX mapping allows for the identification of the main components of each layer.
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To solve your technical challenges in a ONE-STOP manner, our team of 1,300 technical specialists will respond quickly and accurately while maintaining strict confidentiality. With bases in six locations nationwide, our experts in various fields utilize the latest analytical testing equipment to meet all your needs. We are confident that we can provide results that will satisfy you, and we would be grateful if you could give us a try.
