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  4. Other measuring instruments
  5. Other measurement, recording and measuring instruments
  6. Reflectance Measurement Device MSP-100

Reflectance Measurement Device MSP-100

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last updated:Oct 05, 2018

渋谷光学
渋谷光学
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Achieved at an unprecedented low cost.

- By adopting a special half-mirror (patented), it cuts off back surface reflection light, allowing for accurate measurements in a short time without any back surface treatment. (Measurement of reflectance for a thin plate of 0.2mm is possible: using a ×20 objective lens) - It is also possible to measure lens curvature and coating unevenness. (Connecting micro spots (φ50μm) on the sample surface) - High reproducibility measurements can be achieved in a short time even for low-reflectance samples. (Thanks to a unique optical design that maximizes light intake, it features a 512-element linear PDA, a built-in 16-bit A/D converter, and a USB2.0 interface for fast calculations) - Colorimetric measurements and L*a*b* measurements are possible. Object measurements can be performed based on spectral reflectance using spectrophotometry. - Data can be saved in Microsoft Excel(R) format. - Single-layer films can be measured non-contact and non-destructively. - It has a function to display multiple measurement results on the same screen, making it easy to compare results.

    Other measurement, recording and measuring instruments
reflect02.jpg

Reflectance Measurement Device MSP-100

reflect02.jpg
reflect02.jpg
  • Related Link - https://www.shibuya-opt.co.jp/m_reflect.html

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basic information

Measurement wavelength: 380–1050nm Measurement reproducibility: ±0.2% (380–450nm), ±0.02% (451–950nm), ±0.2% (951–1050nm) Sample side N.A.: N.A. 0.12 (when using 10× objective lens) Sample measurement range: φ50μm (when using 10× objective lens) Sample curvature radius: -1R to -∞, +1R to ∞ Display resolution: 1nm Measurement time: Several seconds to over ten seconds (varies with sampling time) External dimensions: (W)230×(H)560×(D)460mm (main unit only) Operating temperature range: 18–28℃ Operating humidity: 60% or less (no condensation)

Price information

4,000,000 yen

Price range

P5

Delivery Time

Please contact us for details

※Please contact us.

Applications/Examples of results

High-speed, high-precision measurement of microdomains, curved surfaces, and ultra-thin samples. Please contact us if you would like a demonstration.

Company information

渋谷光学

渋谷光学

Optical Instruments

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Shibuya Optical is a company engaged in the design, manufacturing, and sales of optical-related products. Founded in 1963, it is headquartered in Wako City, Saitama Prefecture. Based on the design and processing know-how cultivated over 60 years, we provide quality, delivery times, and prices that meet our customers' expectations. Starting in 2024, we became a sales agent for SUPERWAVE, a laser processing machine manufacturer. SUPERWAVE has obtained ISO 9001 and CE marks, contributing to the high efficiency of high-quality and reliable laser precision processing. If you are looking for a laser processing machine or have any issues regarding laser precision processing, please consult Shibuya Optical. Whether you want to say, "I want to do this kind of processing," "Can it be customized?" or "Which laser should I choose?" for any concerns regarding laser processing, please consult Shibuya Optical. We can also assist with prototype production and provide demonstration processing with customer presence at our facility. We will help you with the introduction of laser processing machines.

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