This is a test socket using a coaxial type four-terminal contact probe!
The "W-CSP" is a testing socket that allows for manual measurements using a coaxial four-terminal contact probe (PATENT) after dicing chips from a wafer. It can be used for chip development, sampling inspections, and failure analysis. The socket cover is detachable and can also be used for automatic machine (handler-type) testing. 【Features】 ■ Capable of functional verification testing for BGA, LGA, and bare chips ■ Capable of measuring the on-resistance of MOS-FETs ■ Capable of measuring voltage between terminals *For more details, please download the PDF or feel free to contact us.
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basic information
【Terminal Block】 ■I Terminal: Current Terminal ・Four lead terminals from the external conductor ■V Terminal: Voltage Terminal ・Four lead terminals from the internal conductor ■Chip Size ・Opening 1.0mm ■Chip Ball Diameter ・φ0.26 (0.4P) ■Wiring Board ・Flexible Printed Circuit Board *For more details, please download the PDF or feel free to contact us.
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Since its establishment 37 years ago, Toyo Electronic Research Co., Ltd. has been a specialized manufacturer of electronic device inspection unit jigs, responding to our customers' needs. We are constantly challenging ourselves to create high-difficulty products and aim to produce "high-quality" products that satisfy our customers, so please feel free to contact us with your requests.
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