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  3. Measurement and Analysis
  4. Microscopes
  5. Electron microscope
  6. Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

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last updated:Oct 19, 2020

日本カンタム・デザイン
日本カンタム・デザイン
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Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

    Electron microscope
NaioAFM_00_2.png

Compact AFM "NaioAFM" *Demo now available

NaioAFM_00_2.png
NaioAFM_00_2.png s1.png s2.png s3.png s4.png s5.png s6.png
  • Related Link - https://www.qd-japan.com/products/naioafm/
  • Special site - Product/service details - https://pr.mono.ipros.com/qd-japan/product/

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【Specifications】 ◎Scan range (resolution): 70μm (1.0 nm) ◎Z noise level (when using Static/Dynamic mode): typ. 0.4nm (max. 0.8nm) / typ. 0.3nm (max. 0.8nm) ◎Maximum sample size: within 12mm square / up to 3.5mm in height ◎Sample stage movement range: 12mm in-plane ◎Device size (length x width x height): 204×204×160mm ◎Weight: 6.5kg ◎Power: 100–240VAC (30W) 【Applications】 Surface shape measurement in nanotechnology education at universities and vocational schools, as well as in research and development or quality control settings.

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Nanosurf Corporation Scanning Probe Microscopes (Atomic Force Microscopes AFM and Scanning Tunneling Microscopes STM) Comprehensive Catalog

Nanosurf Corporation Scanning Probe Microscopes (Atomic Force Microscopes AFM and Scanning Tunneling Microscopes STM) Comprehensive Catalog

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日本カンタム・デザイン

日本カンタム・デザイン

Testing, Analysis and Measurement

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Our company was established as the Japanese subsidiary of a foreign-affiliated manufacturer with a global network spanning over 40 countries. We are steadily expanding our business primarily through the sale of SQUID magnetic property measurement devices and physical property measurement devices, which boast a world-class share in the field of new material research and development. Additionally, we also operate as a trading company for high-tech scientific instruments, importing and selling cutting-edge research equipment from around the world in various fields such as material science, biotechnology, and nanotechnology. The wave of technological innovation is significantly transforming not only industrial sectors but also our daily lives. Among these, the fields of material science, biotechnology, and nanotechnology, which are the pillars of our business, can be described as "core technologies" that provide humanity with infinite possibilities for the future as they lead the way in cutting-edge technology (high-tech). The discovery of high-temperature superconducting materials, applications of laser microfabrication and optical communication, and surface analysis at the nanoscale are already playing important roles in various fields such as new materials, semiconductors, information and communication, medical care, clinical diagnostics, and drug discovery, while also enabling further advancements in technology.

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