Analysis services using scanning electron microscopy and energy-dispersive X-ray spectroscopy.

Sample preparation can be performed through resin embedding, cutting, and grinding, allowing for cross-sectional shape observation and elemental analysis.

At Sanko Analysis Center Co., Ltd., we conduct analyses using a scanning electron microscope (SEM) and an energy-dispersive X-ray spectrometer (EDS). With the scanning electron microscope (SEM), we scan the sample with an electron beam and observe the shape of the sample by converting secondary electrons and backscattered electrons emitted from the surface into images. (30x to 300,000x) With the energy-dispersive X-ray spectrometer (EDS), we perform qualitative elemental analysis by detecting characteristic X-rays emitted from the sample when the electron beam is scanned, and we conduct quantitative elemental analysis using the fundamental parameter method by measuring the intensity of the characteristic X-rays. Additionally, we take photographs of the SEM images of the specified areas and report them. Length measurement and 3D imaging are available upon request. *For more details, please download the PDF or feel free to contact us.

X-ray fluorescence analyzerSpectroscopic Analysis Equipment