All-in-one fluorescent X-ray analysis device Zetium
All-in-one fluorescent X-ray analysis device Zetium
Equipped with both wavelength dispersive (WD) and energy dispersive (ED) core technologies in one device.
Integration of multiple X-ray technologies (WDX/EDX/XRD) into a single unit. Zetium achieves the integration of wavelength dispersive technology, capable of high-sensitivity analysis of light elements, and energy dispersive technology, suitable for high-speed analysis and micro-area analysis, into one platform. By simultaneously reading the optical system of WDX, which excels at light elements, and the optical system of EDX, which detects heavy elements with high resolution, it provides optimal measurement conditions that were difficult to achieve with conventional WDX-only devices. ● Covers a wide range of elements with up to five detectors - Gas flow detector (for light elements) - Hyperscintillation detector (for heavy elements) - Xe shield detector (for intermediate element high-sensitivity measurement) - Hyper-channel fixed detector (for specific elements) - SDD detector (for EDX measurement) ● From research and development in the lab to measurement automation in factories It supports measurement automation and offers suggestions for the device specifications and integration methods tailored to the condition of the customer's equipment. Flexibly responds to high precision, high-speed, and micro-area analysis needs with an optimal optical system. Additionally, with optional selections, quantification of free lime is also possible.
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basic information
**Main Features** ● By simultaneously measuring with wavelength dispersion, which excels in the light element region, and energy dispersion, which is proficient in the heavy element region, analysis with the highest sensitivity is achieved across the entire measurement range from Be4 to Am95. ● Simultaneous measurement using wavelength dispersion and energy dispersion reduces analysis time by up to 50%. ● By using an energy-dispersive detector that allows simultaneous measurement of all elements, rather than a wavelength-dispersive type that measures one element at a time, micro-area measurement and mapping analysis can be performed in a much shorter time than conventional technologies. ● The newly developed X-ray tube SSTR-mAX, realized with patented Zeta technology, offers the highest stability and long lifespan. ● High-precision free lime quantification using transmission methods is possible with the THETA core option. ● High-precision non-standard FP quantification software utilizing scattering line correction.
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Applications/Examples of results
- ROHS & WEEE - ELV measures - Environmental analysis of the Japanese Pharmacopoeia - Geology - Agriculture - Environment (soil regeneration, waste oil, emission testing, etc.) - Petrochemicals - Recycling industry - Catalyst industry - Electrical and electronic industry - Metals - Cement - Pharmaceuticals - Polymers - Mining - Ceramics - Environment - Food
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Company information
We are the Japan division of Malvern Panalytical, a company that provides particle measurement devices and X-ray analysis equipment. Based in Tokyo and Kobe, we have a total of six sales offices and two application laboratories across the country, where we offer sales, services, and support for particle measurement and X-ray analysis devices, as well as various events such as seminars. Malvern, which has products in particle measurement and thermal analysis (calorimetry), merged with Panalytical, a manufacturer of X-ray diffraction and fluorescence X-ray analysis equipment, in 2018. The integration of these two leading companies in their respective fields allows us to provide cutting-edge solutions to a wide range of industries involved in R&D, process control, quality management, and material property analysis.
![[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.](https://image.mono.ipros.com/public/product/image/d3e/2000325882/IPROS6547567656230940718.jpg?w=280&h=280)
![[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF](https://image.mono.ipros.com/public/product/image/339/2000325880/IPROS7525576951874684063.jpg?w=280&h=280)
