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  5. X-ray fluorescence analyzer
  6. All-in-one fluorescent X-ray analysis device Zetium

All-in-one fluorescent X-ray analysis device Zetium

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All-in-one fluorescent X-ray analysis device Zetium

last updated:Feb 05, 2020

スペクトリス株式会社 マルバーン・パナリティカル事業部
スペクトリス株式会社 マルバーン・パナリティカル事業部
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Equipped with both wavelength dispersive (WD) and energy dispersive (ED) core technologies in one device.

Integration of multiple X-ray technologies (WDX/EDX/XRD) into a single unit. Zetium achieves the integration of wavelength dispersive technology, capable of high-sensitivity analysis of light elements, and energy dispersive technology, suitable for high-speed analysis and micro-area analysis, into one platform. By simultaneously reading the optical system of WDX, which excels at light elements, and the optical system of EDX, which detects heavy elements with high resolution, it provides optimal measurement conditions that were difficult to achieve with conventional WDX-only devices. ● Covers a wide range of elements with up to five detectors - Gas flow detector (for light elements) - Hyperscintillation detector (for heavy elements) - Xe shield detector (for intermediate element high-sensitivity measurement) - Hyper-channel fixed detector (for specific elements) - SDD detector (for EDX measurement) ● From research and development in the lab to measurement automation in factories It supports measurement automation and offers suggestions for the device specifications and integration methods tailored to the condition of the customer's equipment. Flexibly responds to high precision, high-speed, and micro-area analysis needs with an optimal optical system. Additionally, with optional selections, quantification of free lime is also possible.

    X-ray fluorescence analyzer
IPROS3660322158984515390_220x220.jpg

All-in-one fluorescent X-ray analysis device Zetium

IPROS3660322158984515390_220x220.jpg
IPROS3660322158984515390_220x220.jpg
  • Related Link - https://www.malvernpanalytical.com/jp/products/pro…

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basic information

**Main Features** ● By simultaneously measuring with wavelength dispersion, which excels in the light element region, and energy dispersion, which is proficient in the heavy element region, analysis with the highest sensitivity is achieved across the entire measurement range from Be4 to Am95. ● Simultaneous measurement using wavelength dispersion and energy dispersion reduces analysis time by up to 50%. ● By using an energy-dispersive detector that allows simultaneous measurement of all elements, rather than a wavelength-dispersive type that measures one element at a time, micro-area measurement and mapping analysis can be performed in a much shorter time than conventional technologies. ● The newly developed X-ray tube SSTR-mAX, realized with patented Zeta technology, offers the highest stability and long lifespan. ● High-precision free lime quantification using transmission methods is possible with the THETA core option. ● High-precision non-standard FP quantification software utilizing scattering line correction.

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Applications/Examples of results

- ROHS & WEEE - ELV measures - Environmental analysis of the Japanese Pharmacopoeia - Geology - Agriculture - Environment (soil regeneration, waste oil, emission testing, etc.) - Petrochemicals - Recycling industry - Catalyst industry - Electrical and electronic industry - Metals - Cement - Pharmaceuticals - Polymers - Mining - Ceramics - Environment - Food

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We will be exhibiting at JASIS2022!

  • Seminar・Event

At this year's JASIS 2022, we have expanded the number of booths compared to last year, allowing you to see more devices. We will showcase tabletop X-ray diffraction devices, X-ray fluorescence analyzers, laser diffraction particle size distribution measurement devices, as well as accessories for dynamic particle image analysis, dynamic light scattering particle size, zeta potential, and molecular weight measurement devices. Additionally, we have a well-equipped panel exhibition area, so please be sure to visit us at Makuhari Messe. Booth: Space Number 6B-407 Spectris plc Malvern Panalytical

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Company information

スペクトリス株式会社

スペクトリス株式会社 マルバーン・パナリティカル事業部

Testing, Analysis and Measurement

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We are the Japan division of Malvern Panalytical, a company that provides particle measurement devices and X-ray analysis equipment. Based in Tokyo and Kobe, we have a total of six sales offices and two application laboratories across the country, where we offer sales, services, and support for particle measurement and X-ray analysis devices, as well as various events such as seminars. Malvern, which has products in particle measurement and thermal analysis (calorimetry), merged with Panalytical, a manufacturer of X-ray diffraction and fluorescence X-ray analysis equipment, in 2018. The integration of these two leading companies in their respective fields allows us to provide cutting-edge solutions to a wide range of industries involved in R&D, process control, quality management, and material property analysis.

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