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  6. Surface Particle Detector "QIII SM / ST / SX"

Surface Particle Detector "QIII SM / ST / SX"

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QIII SM / ST / SX

last updated:Feb 16, 2024

MIT Inc.
MIT Inc.
  • Official site

Particles on the sample surface can be measured easily and quickly!

The "QIII" manufactured by Pentagon Technologies is a device capable of detecting and measuring particles on sample surfaces in just a few seconds. It allows for easy and rapid measurement of particles on sample surfaces, enabling the quantification of cleaning procedures and standards, thereby reducing variability in particle management without relying on the operator's intuition and experience. It is suitable for quality checks before shipment and upon receipt of precision cleaning parts, as well as for maintaining cleanliness in various manufacturing equipment. Additionally, the "QIII SM / QIII ST" is equipped with Pentagon's unique technology designed for use in today's clean environments. 【Features】 ■ Detects/measures particles (0.1um and above) on sample surfaces in seconds ■ Clear and distinct screen display provided by a 7-inch high-resolution WVGA screen ■ Measured data can be easily downloaded directly via USB port *For more details, please refer to the PDF document or feel free to contact us.

    Particle Counter
QIII-SM.jpg

Surface Particle Detector "QIII SM / ST / SX"

QIII-SM.jpg
QIII-SM.jpg
  • Related Link - https://www.mit-co.com/products/particle.html

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basic information

**Effects** - Reduction of troubles caused by particles - Management and quantification of surface cleanliness - Reduction in the number of maintenance cycles for various devices **Measurement Range** - QIII SM: 0.3/ 0.5/ 1.0/ 3.0/ 5.0/ 10.0 μm - QIII ST: 0.1/ 0.2/ 0.3/ 1.0/ 3.0/ 5.0 μm - QIII SX: 5/ 10/ 25/ 50/ 100/ 125 μm *For more details, please refer to the PDF document or feel free to contact us.*

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Applications/Examples of results

【Purpose】 ■ Quality confirmation of precision cleaning parts before shipment and upon receipt ■ Clean maintenance management of various manufacturing equipment ■ Cleaning level inspection of sample surfaces that require cleaning *For more details, please refer to the PDF document or feel free to contact us.

Detailed information

  • QIII-SM.jpg

    QIII SM Measurement range: 0.3/ 0.5/ 1.0/ 3.0/ 5.0/ 10.0 μm

  • QIII-ST.jpg

    QIII ST Measurement range: 0.1 / 0.2 / 0.3 / 1.0 / 3.0 / 5.0 μm

  • QIII-SX-1.jpg

    QIII SX Measurement range: 5/ 10/ 25/ 50/ 100/ 125 μm

Line up(3)

Model number overview
QIII SM Measurement range: 0.3/ 0.5/ 1.0/ 3.0/ 5.0/ 10.0 μm
QIII ST Measurement range: 0.1/ 0.2/ 0.3/ 1.0/ 3.0 / 5.0 μm
QIII SX Measurement range: 5/ 10/ 25/ 50/ 100/ 125 μm

catalog(1)

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Surface Particle Detector "Pentagon QIII SM / ST"

Surface Particle Detector "Pentagon QIII SM / ST"

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MIT

MIT Inc.

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MIT Inc. responds to your needs with high expertise, accurately and swiftly, from the sale of various measuring instruments from a wide range of products used in clean rooms to the development and provision of experimental visualization engine systems essential for engine development.

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