We support your research and development by identifying the main components of products and materials.
We provide information that leads to solving our customers' challenges by identifying the types and composition ratios of elements contained in various products and materials. The methods used for analysis include EDX, WDX, XRF, and ICP.
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basic information
**Features** ● SEM-EDX: Simultaneous multi-element analysis By analyzing while observing the sample, it is possible to target and analyze foreign substances smaller than 100μm. The analysis depth is about 1μm, making it suitable for surface analysis. ● WDX (FE-EPMA): Excellent energy resolution With an energy resolution of about 10eV, it is possible to analyze peaks that cannot be separated by EDX (such as Cr and O, Fe and F, Mo and S, Ag and Pd). ● ED-XRF: Non-destructive analysis It can analyze a wide range (φ10mm, φ3mm, φ1mm, φ0.3mm) evenly to a considerable depth (tens of μm for metals, a few mm for resins), making it suitable for bulk sample analysis. ● ICP Qualitative and quantitative analysis of elements can be performed using ICP-MS or ICP-AES. ICP-MS can measure concentrations in liquid at the μg/L (ppb) level and is used for trace element measurement. ICP-AES is used for measuring high matrix samples due to its low interference.
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Applications/Examples of results
●Component analysis of materials ●Silicon line analysis of anodized coatings ●Material analysis of metal products
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
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