Are you struggling with cracks and chipping caused by residual stress due to metal fatigue?
Analyzing the causes of cracks/chips in metals by measuring residual stress! Measuring tensile and compressive stresses in mechanical parts and transport equipment in a "non-destructive & non-invasive" manner.
Are you struggling with cracks/chips caused by residual stress due to metal fatigue? "Cracking occurs when placed down..." "Welded areas often crack..." "I want to improve the durability of metal products..." and so on. By measuring the residual stress remaining on the surface of steel materials, we can clarify the causes of metal cracking/chipping, which also helps optimize quality control and maintenance! *For more details, please download the PDF or feel free to contact us.
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Pulse Tech Industries has aimed to be a "research and development-oriented manufacturing company" since its founding, engaging in numerous projects such as labor-saving devices and inspection equipment that are difficult to address with existing products, thereby contributing to the improvement of our customers' productivity and quality. The "portable X-ray residual stress measurement device" and "fluorescent detection head" are products developed in-house by combining the elemental technologies we have cultivated over the years, and they have received high praise from various sectors. We offer optimal solutions tailored to our customers' needs, including challenging issues, custom equipment, joint development, and engineer dispatch, so please feel free to contact us. Engineers responding to custom needs (special specifications): X-ray handling technology - 37 X-ray work supervisors Circuit design technology - 3 electrical equipment assembly technicians Optical design technology - 10 international optical engineers Mechanical design technology - 7 mechanical design engineers - 19 metal materials testing technicians - 3 3D CAD users Software development technology - 23 information technology specialists - 2 software quality technicians - 3 holders of LabVIEW certification