High-frequency/High-speed transmission design support software

Extracting S-parameter data from the measurement data of the entire mounting fixture is easy!

"In Situ De-embedding (ISD)" is software that allows for the de-embedding of measurement data from the entire fixture containing the device under test, enabling the extraction of S-parameter data for the device under test with very simple operations. Additionally, during the de-embedding process, the S-parameters are corrected in the time domain, resulting in outcomes that satisfy passivity and causality. 【Features】 ■ Compared to other methods such as the general TRL method, it allows for the easy and accurate extraction of data for the device under test. ■ It can be used for high-frequency components such as capacitors, inductors, resistors, filters, ICs, multi-terminal components like differential devices and high-speed transmission connectors, as well as high-frequency elements measured on-wafer, all of which are evaluated using S-parameters. *For more details, please download the PDF or feel free to contact us.

Other measurement, recording and measuring instrumentsSoftware (middle, driver, security, etc.)