Extracting S-parameter data from the measurement data of the entire mounting fixture is easy!
"In Situ De-embedding (ISD)" is software that allows for the de-embedding of measurement data from the entire fixture containing the device under test, enabling the extraction of S-parameter data for the device under test with very simple operations. Additionally, during the de-embedding process, the S-parameters are corrected in the time domain, resulting in outcomes that satisfy passivity and causality. 【Features】 ■ Compared to other methods such as the general TRL method, it allows for the easy and accurate extraction of data for the device under test. ■ It can be used for high-frequency components such as capacitors, inductors, resistors, filters, ICs, multi-terminal components like differential devices and high-speed transmission connectors, as well as high-frequency elements measured on-wafer, all of which are evaluated using S-parameters. *For more details, please download the PDF or feel free to contact us.
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【Other Products】 ■Advanced SI Design Kits (ADK) ■Material Property Extractor (MPX) ■WAVE 3D, etc. *For more details, please download the PDF or feel free to contact us.
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Bifurestech Co., Ltd. is engaged in the development of technologies related to optical discs, the development of electronic devices (including transducers and sensors), and the product development of various audio equipment. As a group of technical experts in the field of product development, we have seen rapid expansion in contract technology development in the energy and healthcare sectors in recent years. Please feel free to contact us if you have any inquiries.