[Free Gift] Introducing a product that is a new approach utilizing the MIRS method.
The characteristics of the surface of silicon wafers (Si wafers) greatly influence their functionality as a material, and the chemical evaluation of various thin films formed on the wafer surface is becoming increasingly important. The "Wafer ATR" introduced in this document is a new approach that applies the so-called MIRS method, and it is a product of research results in collaboration with the group at the CEA-Leti, the French Atomic Energy Commission's electronics and information research institute. [Contents] ■ Introduction ■ Wafer ATR - Improved sensitivity through multiple internal reflections - Necessary information during measurement ■ Measurement examples ■ Discriminant analysis ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.
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【Product Features】 <High-End FT-IR: VERTEX Series> ■ Designed for maximum flexibility ■ Composed of an upgradeable optical platform *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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The optics business started in 1960 as the infrared spectroscopy division of the Bruker Group in Germany. The range of products developed based on high design philosophy varies from dedicated machines used daily for production management and quality assurance to research models that demonstrate their power in the research and development of advanced materials. With Ettlingen, Germany, as the base for development and manufacturing, we respond to various customer needs through a global sales and service network.