SiC microscopic observation device "SCM-100"

Microscopic images of SiC samples captured with a camera, real-time LCD output.

The SCM-100 is a SiC microscopic observation device that has the function of applying a pre-programmed current to the built-in diode of a SiC sample's transistor. During current application, areas where no current flows (defects) do not emit light, allowing for the detection of defects by capturing images with a camera attached to the microscope. 【Features】 ■ Capture intervals from 3 seconds to 24 hours, with a maximum of 999 images that can be saved to an SD card ■ Output voltage, output current, and status information can be sampled at a maximum speed of 0.1 seconds ■ Control of 5 power supplies and data storage possible with a single PC ■ When output to a 17-inch LCD, the observation magnification is approximately 60x to 200x ■ Allows for real-time observation of defect growth in SiC samples *For more details, please download the PDF or feel free to contact us.

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